Publications

• Article dans une revue

Radio-frequency and low noise characteristics of SOI technology on plastic for flexible electronics

A. Lecavelier Des Etangs-Levallois, Marie Lesecq, Francois Danneville, Y. Tagro, Sylvie Lepilliet, Virginie Hoel, David Troadec, D. Gloria, C. Raynaud, Emmanuel Dubois

In this work, we report on the HF performance and noise characteristics of 65 nm SOI-CMOS technology transferred onto plastic films. After transfer-bonding onto a thin flexible substrate, RF-SOI-MOSFETs are shown to feature high unity-current-gain cutoff and maximum oscillation frequencies f T /f…

Solid-State Electronics, 2013, 90, pp.73-78. ⟨10.1016/j.sse.2013.02.049⟩. ⟨hal-00914203⟩

• Communication dans un congrès

Caractérisation et étude du temps de transit des électrons dans une structure HEMT à hétérojonction InAlN/GaN

Alain Agboton

16èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2013, 2013, Grenoble, France. 4 p. ⟨hal-00957791⟩

• Communication dans un congrès

Phase change memory for neuromorphic systems and applications

M. Suri, O. Bichler, D. Querlioz, V. Sousa, L. Perniola, D. Vuillaume, C. Gamrat, B. de Salvo

12th European-Phase Change and Ovonics Symposium, E-PCOS 2013, 2013, Berlin, Germany. ⟨hal-00957793⟩

• Communication dans un congrès

Extraordinary room temperature THz heterodyne detector: the self-switching nanodiode

J. Torres, P. Nouvel, A. Penot, L. Varani, P. Sangare, B. Grimbert, M. Faucher, Guillaume Ducournau, Christophe Gaquière, I. Iniguez-De-La-Torre, J. Mateos, T. Gonzalez

18th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructure, 2013, Matsue, Japan. ⟨hal-01926264⟩

• Article dans une revue

Ultrafast optical technique for measuring the electrical dependence of the elasticity of piezoelectric thin film : demonstration on AlN

Arnaud Devos, P. Emery, E. Defay, N. Ben Hassine, G. Parat

We present a technique based on ultrafast acoustics which permits us to measure the electrical dependence of the elastic properties of a thin piezoelectric layer. Ultrafast acoustics offers a unique way of measuring elastic properties of thin-layer in a non-destructive way using ultrashort optical…

Review of Scientific Instruments, 2013, 84, pp.015007-1-4. ⟨10.1063/1.4788936⟩. ⟨hal-00796410⟩

• Autre publication scientifique

Modelling Of Supramolecular Network Deposited On A Semiconductor Surface

Guillaume Copie, Christophe Krzeminski, Fabrizio Cleri, Younes Makoudi, B. Grandidier, Frédéric Cherioux, Frank Palmino

We investigated the self-assembly mechanisms and electronic properties of highly- symmetric organic molecules based on a substituted 1,2,5-tri(4-phenyl)benzene core[1], deposited on a passivated boron-doped Si(111)-√3x√3 R30° surface, by using ab-initio calculations, empirical molecular dynamics…

2013. ⟨hal-00941972⟩

• Communication dans un congrès

InAlAs/InGaAa HEMTs on polyimide flexible substrate with high cut-off frequencies

J.S. Shi, Nicolas Wichmann, Yannick Roelens, S. Bollaert

Journées Nationales Technologies Emergentes en Micro-Nanofabrication, JNTE 2013, 2013, Evian, France. ⟨hal-00813609⟩

• Autre publication scientifique

Vers une électronique terahertz : contribution à la technologie des transistors III-V

Mohammed Zaknoune

2013. ⟨hal-00813614⟩

• Communication dans un congrès

Laser ultrasonics and mode conversion for flaw depth gauging

Frédéric Faëse, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak

Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, allowing high temperature and/or geometrically complex materials testing. In…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15509, 9 p. ⟨hal-00971600⟩

• Communication dans un congrès

Interferometric scanning microwave microscope for nanotechnology application

N. Clement, Thomas Dargent, H. Tanbakuchi, K. Nishiguchi, R. Sivakumarasamy, F. Wang, A. Fujiwara, D. Ducatteau, Gilles Dambrine, D. Vuillaume, Bernard Legrand, D. Theron

American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811777⟩