Publications

• Article dans une revue

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois

In this paper, we present results of transmission electron microscopy studies on erbium silicide structures fabricated under various thermal conditions. A titanium cap has been used as a protective layer against oxidation during rapid thermal annealing of an erbium layer in a temperature range of…

Journal of Microscopy, 2010, EM 2008 ‐ XIII International Conference on Electron Microscopy, 237 (3), pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩. ⟨hal-00549623⟩

• Article dans une revue

Confined VLS growth and structural characterization of silicon nanoribbons

Aurélie Lecestre, Emmanuel Dubois, A. Villaret, T. Skotnicki, P. Coronel, G. Patriarche, C. Maurice

Confined VLS growth is proposed to produce single crystalline silicon (c-Si) film over an amorphous oxide layer, without crystalline seed. The guided growth of Si nanoribbons (NRs) is successfully demonstrated and characterized using several electron microscopy techniques. First, VLS growth is…

Microelectronic Engineering, 2010, 87 (5-8), pp.1522-1526. ⟨10.1016/j.mee.2009.11.053⟩. ⟨hal-00549560⟩

• Article dans une revue

Fabrication of 24-MHz-disk resonators with silicon passive integration technology

M. Sworowski, F. Neuilly, Bernard Legrand, A. Summanwar, P. Philippe, L. Buchaillot

IEEE Electron Device Letters, 2010, 31, pp.23-25. ⟨10.1109/LED.2009.2034542⟩. ⟨hal-00548984⟩

• Article dans une revue

Three-terminal junctions operating as mixers, frequency doublers and detectors : a broad-band frequency numerical and experimental study at room temperature

I. Iniguez-De-La-Torre, T. Gonzalez, D. Pardo, C. Gardes, Yannick Roelens, S. Bollaert, A. Curutchet, Christophe Gaquière, J. Mateos

Semiconductor Science and Technology, 2010, 25, pp.125013-1-14. ⟨10.1088/0268-1242/25/12/125013⟩. ⟨hal-00548604⟩

• Article dans une revue

Negative refraction of surface acoustic waves in the subgigahertz range

Bernard Bonello, Laurent Belliard, Juliette Pierre, Jerome O. Vasseur, Bernard Perrin, Olga Boyko-Kazymyrenko

We used the picosecond ultrasonic technique to experimentally demonstrate the negative refraction of surface acoustic waves in a two-dimensional phononic crystal. The sample is made of a square lattice of circular voids drilled at the surface of a thick silica substrate. The lattice parameter is of…

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2010, 82, pp.104109-1-5. ⟨10.1103/PhysRevB.82.104109⟩. ⟨hal-00549435⟩

• Article dans une revue

Parasitic effects and traps in AlGaN/GaN HEMT on sapphire substrate

O. Fathallah, M. Gassoumi, B. Grimbert, Christophe Gaquière, H. Maaref

European Physical Journal: Applied Physics, 2010, 51, pp.10304-1-5. ⟨10.1051/epjap/2010085⟩. ⟨hal-00549476⟩

• Communication dans un congrès

High efficiency optoelectronic terahertz sources

Jean-Francois Lampin, Emilien Peytavit, Tahsin Akalin, Guillaume Ducournau, Francis Hindle, Gaël Mouret

We have developed a new generation of optoelectronic large bandwidth terahertz sources based on TEM horn antennas monolithically integrated with several types of photodetectors: low-temperature grown GaAs (LTG-GaAs) planar photoconductors, vertically integrated LTG-GaAs photoconductors on silicon…

SPIE Optics+Photonics, Terahertz Emitters, Receivers, and Applications, Aug 2010, San Diego, CA, United States. pp.77630A-1-7, ⟨10.1117/12.860883⟩. ⟨hal-00591738⟩

• Article dans une revue

Au-Si and Au-Ge phases diagrams for nanosytems

D. Hourlier, P. Perrot

Materials Science Forum, 2010, 653, pp.77-85. ⟨10.4028/www.scientific.net/MSF.653.77⟩. ⟨hal-00591737⟩

• Communication dans un congrès

Submillimetric high resolution passive imaging system using synthesis aperture technique

G. Desruelles, N. Rolland, P. Rolland

7th European Radar Conference, EuRAD 2010, 2010, France. pp.280-283. ⟨hal-00549934⟩

• Communication dans un congrès

Backgate bias and stress level impact on giant piezoresistance effect in thin silicon films and nanowires

V. Passi, J.P. Raskin, F. Ravaux, Emmanuel Dubois

23rd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2010, 2010, China. pp.464-467, ⟨10.1109/MEMSYS.2010.5442464⟩. ⟨hal-00549973⟩