Publicaciones

• Article dans une revue

A simple method for measuring Si-Fin sidewall roughness by AFM

X.H. Tang, V. Bayot, N. Reckinger, D. Flandre, J.P. Raskin, Emmanuel Dubois, B. Nysten

The gate oxide reliability and the electrical behavior of FinFETs are directly related to the surface characteristics of the fin vertical sidewalls. The surface roughness of the fin sidewalls is one of the most important structural parameters to be monitoredin order to optimize the fin patterning...

IEEE Transactions on Nanotechnology, 2009, 8, pp.611-616. ⟨10.1109/TNANO.2009.2021064⟩. ⟨hal-00471972⟩

• Communication dans un congrès

Novel approach for planar Bragg grating characterization using prism coupling

J. Pello, T. Le, A. Lim, El Hadj Dogheche, M. Kaba, K. Pita, Didier Decoster, J.P. Huignard, S.C. Tjin, J. Chazelas

Asia Communications and Photonics Conference and Exhibition, ACP 2009, Optoelectronic Materials and Devices IV, 2009, China. pp.76310A-1-7, ⟨10.1117/12.852247⟩. ⟨hal-00579156⟩

• Article dans une revue

2x2 InP optical switching matrix based on carrier-induced effects for 1.55-µm applications

Malek Zegaoui, Nargess Choueib, Joseph Harari, Didier Decoster, V. Magnin, X. Wallart, Jean Chazelas

This letter demonstrates a 2 × 2 low optical crosstalk and low power consumption switching matrix device based on carrier-induced effects on an InP substrate. The matrix device comprises two digital optical switches (DOSs) with a wide multimode Y-junction associated with a sinusoidal passive...

IEEE Photonics Technology Letters, 2009, 21 (19), pp.1357-1359. ⟨10.1109/LPT.2009.2026484⟩. ⟨hal-00472780⟩

• Article dans une revue

Self-heating phenomena in high-power III-N transistors and new thermal characterization methods developed within EU project TARGET

J. Kuzmik, S. Bychikhin, E. Pichonat, Christophe Gaquière, E. Morvan, E. Kohn, Jean-Pierre Teyssier, D. Pogany

In the framework of the Top Amplifier Research Groups in a European Team (TARGET) project, we developed a new electrical method for the temperature measurement of HEMTs and performed several unique studies on the self-heating effects in AlGaN/GaN HEMTs. This method, in combination with transient...

International Journal of Microwave and Wireless Technologies, 2009, 1, pp.153 - 160. ⟨10.1017/S1759078709990444⟩. ⟨hal-00514218⟩

• Communication dans un congrès

Observation of the 'lobe structure' in the ballistic interferometers

Y. Yamauchi, M. Hashisaka, S. Nakamura, K. Chida, S. Kasai, T. Ono, R. Leturcq, K. Ensslin, D.C. Driscoll, A.C. Gossard, K. Kobayashi

18th International Conference on Electronic Properties of Two-Dimensional Systems, EP2DS-18, 2009, Kobe, Japan. ⟨hal-00575422⟩

• Communication dans un congrès

Acoustic waves in layered media : comparative study of Raman scattering and reflection delay time

E.H. El Boudouti, R. Zelmat, Y. El Hassouani, R. Bailich, Bahram Djafari-Rouhani

15th International Conference on Photoacoustic and Photothermal Phenomena, ICPPP15, 2009, Leuven, Belgium. ⟨hal-00575398⟩

• Communication dans un congrès

Comportement dynamique de microscopie Kelvin en mode AM sous ultravide

H. Diesinger, D. Deresmes, J.P. Nys, Thierry Melin

Forum des Microscopies à Sonde Locale, 2009, Hardelot, France. ⟨hal-00575395⟩

• Communication dans un congrès

Atomic scale structure of <111>-oriented Si nanowire

T. Xu

• Communication dans un congrès

Study of nano-domains by piezoresponse force microscopy of relaxor PMN-PT thin films : influence of the annealing temperature, film thickness and composition

M. Detalle, R. Liang, Caroline Soyer, Denis Remiens, X. Dong

European Materials Research Society Spring Meeting, E-MRS Spring 2009, Symposium H : Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II, 2009, Strasbourg, France. ⟨hal-00575749⟩

• Communication dans un congrès

Integration and optimisation of ferroelectric thin films in micro and nano dimensional structures

Denis Remiens

Sino-French Workshop, 2009, Shanghai, China. ⟨hal-00575745⟩