Publicaciones

• Article dans une revue

Physical study of the dissipated power area in high electron mobility transistors for thermal modelling

Brahim Benbakhti, Michel Rousseau, Jean-Claude de Jaeger

The hot area in power transistors due to the power dissipation is determined from a 2D-hydrodynamic model. The power is calculated everywhere in the device from the knowledge of the physical quantities (current density, electric field). The hot area is determined accurately to be coupled to a...

Microelectronics Journal, 2007, 38 (1), pp.7-13. ⟨10.1016/j.mejo.2006.07.025⟩. ⟨hal-00283492⟩

• Article dans une revue

Pre-processing technique for improving estimation of number of paths embedded in noisy observations

A. Nasr, A. Lienard, Pierre Degauque

Electronics Letters, 2007, 43, pp.1443-1445. ⟨10.1049/el:20072773⟩. ⟨hal-00283956⟩

• Communication dans un congrès

Simulation of an equivalent diagram to a 2D cavity under Qucs

Hadger Moussa, S. Baranowski, M. Cauterman, B. Demoulin

Symposium on Embedded EMC, 2EMC, 2007, France. paper 1D-1-6. ⟨hal-00284444⟩

• Communication dans un congrès

Performances of the HomePlug PHY layer in the context of in-vehicle powerline communications

Virginie Degardin, M. Lienard, Pierre Degauque, Pierre Laly

IEEE International Symposium on Power Line Communications and Its Applications, ISPLC'07, 2007, Italy. pp.93-97, ⟨10.1109/ISPLC.2007.371104⟩. ⟨hal-00284441⟩

• Communication dans un congrès

Characterization of electromagnetic leakages throughout the connector shell

Youssef Bouri, Lamine Kone, Jean Razafiarivelo, David Baudry, S. Baranowski, Bernard Demoulin

The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms...

11th IEEE Workshop on Signal Propagation on Interconnects, SPI 2007, May 2007, Ruta di Camogli, Italy. pp.109-112, ⟨10.1109/SPI.2007.4512224⟩. ⟨hal-00284438⟩

• Article dans une revue

Evaluation of AllnN/GaN HEMTs on sapphire substrate in microwave, time and temperature domains

F Medjdoub, D. Ducatteau, Christophe Gaquière, J.E. Carlin, M. Gonschorek, E. Feltin, M.A. Py, N. Grandjean, E. Kohn

Electronics Letters, 2007, 43, pp.309-311. ⟨10.1049/el:20073170⟩. ⟨hal-00283497⟩

• Communication dans un congrès

Modélisation physique numérique macroscopique pour l'étude de composants semiconducteurs distribués

A. El Moussati, Christophe Dalle

Journées Thématiques du GDR Nanoélectronique sur la Simulation Multiphysique de Composants et Dispositifs Nanométriques, 2007, Villeneuve d'Ascq, France. ⟨hal-00285614⟩

• Communication dans un congrès

High-speed SiGe BiCMOS technologies : 120-nm status and end-of-roadmap challenges

P. Chevalier, B. Barbalat, M. Laurens, B. Vandelle, L. Rubaldo, B. Geynet, S.P. Voinigescu, T.O. Dickson, N. Zerounian, S. Chouteau, D. Dutartre, A. Monroy, F. Aniel, Gilles Dambrine, A. Chantre

7th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2007, 2007, United States. pp.18-23, ⟨10.1109/SMIC.2007.322759⟩. ⟨hal-00284032⟩

• Communication dans un congrès

Monte Carlo comparison between InAlAs/InGaAS double-gate and standard HEMTs

B.G. Vasallo, T. Gonzalez, D. Pardo, J. Mateos, Nicolas Wichmann, S. Bollaert, A. Cappy

Spanish Conference on Electron Devices, 2007, Spain. pp.80-83, ⟨10.1109/SCED.2007.383958⟩. ⟨hal-00284024⟩

• Communication dans un congrès

Low-frequency dynamic drain current modeling in AlGaN-GaN HEMTs

Valeria Di Giacomo, Alberto Santarelli, Fabio Filicori, Antonio Raffo, Giorgio Vannini, Raphaël Aubry, Christophe Gaquière

Low-frequency dispersive effects in AlGaN/GaN HEMTs are here modeled above their cutoff frequencies by adopting a modeling approach developed for GaAs PHEMTs. To this aim, a new identification procedure is proposed, which allows to obtain very accurate predictions of the pulsed drain currents, even...

2nd European Microwave Integrated Circuits Conference, EuMIC 2007, Oct 2007, Munich, Germany. pp.68-71, ⟨10.1109/EMICC.2007.4412649⟩. ⟨hal-00284404⟩