Publicaciones
Affichage de 12951 à 12960 sur 16170
Evidence of surface acoustic wave band gaps in the phononic crystals created on thin plates
X. Zhang, T. Jackson, E. Lafon, P. Deymier, Jerome O. Vasseur
Applied Physics Letters, 2006, 88, pp.041911-1-3. ⟨hal-00127836⟩
Evaluation d'une démarche de modélisation d'équipements électroniques automobiles sur un sous-système réaliste
S. Egot, M. Klingler, L. Kone, S. Baranowski, F. Lafon, C. Marot
2006, pp.273-274. ⟨hal-00142609⟩
Analyse physique de transistors HEMTs AlGaN/GaN élaborés avec la technologie field plate
Brahim Benbakhti, Michel Rousseau, J-C Gerbedoen, Jean-Claude de Jaeger
10èmes Journées de la Matière Condensée, Aug 2006, Toulouse, France. ⟨hal-00128165⟩
Averaging and oversampling correlator receiver with input quantization
Jean-Michel Rouvaen, B. El Khaldi, Atika Rivenq, Yassin El Hillali
Digital Signal Processing, 2006, 16, pp.120-136. ⟨hal-00128166⟩
High resolution seismic investigation in salt mining context. Comparison of seismic sections
Bogdan Piwakowski, L. Driad-Lebeau, A. Kosecki
Proceedings of the 2007 Near-Surface International Symposium of European Association of Exploration Geophysicists, 2006, Helsinki, Finland. ⟨hal-00201151⟩
Behavior of a traveling-wave amplifier versus temperature in SOI technology
M. Si Moussa, C. Pavageau, P. Simon, Francois Danneville, J. Russat, N. Fel, J.P. Raskin, D. Vanhoenacker-Janvier
IEEE Transactions on Microwave Theory and Techniques, 2006, 54, pp.2675-2683. ⟨hal-00126520⟩
Compact-modeling solutions for nanoscale double-gate and gate-all-around MOSFETs
B. Iniguez, T.A. Fjeldly, A. Lazaro, Francois Danneville, M.J. Deen
IEEE Transactions on Electron Devices, 2006, 53, pp.2128-2142. ⟨hal-00126518⟩
A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs
R. Rengel, M.J. Martin, T. Gonzalez, J. Mateos, D. Pardo, Gilles Dambrine, J.P. Raskin, Francois Danneville
IEEE Transactions on Electron Devices, 2006, 53, pp.523-532. ⟨hal-00126521⟩
Role of interfaces on the direct tunneling and inelastic tunneling behaviors through metal/alkylsilane/silicon junctions
D. K. Aswal, C. Petit, G. Salace, David Guérin, S. Lenfant, J.V. Yakhmi, D. Vuillaume
Physica Status Solidi A (applications and materials science), 2006, 203, pp.1464-1469. ⟨hal-00127111⟩
Charge injection and transport through organic monolayer : some interface problems
D. Vuillaume
Electronic Structure and Processes of Molecular-Based Interfaces, ESPMI 06, 2006, Nagoya, Japan. ⟨hal-00127133⟩