Publicaciones

• Autre publication scientifique

Corrigendum: Dynamic micromechanical measurement of the flexural modulus of micrometre-sized diameter single natural fibres using a vibrating microcantilever technique (2024 J. Micromech. Microeng. 34 015009)

Ali Reda, Thomas Dargent, Steve Arscott

Abstract This corrigendum corrects typographic errors in the article. The corrections do not change the conclusions of the article.

2024, pp.049501. ⟨10.1088/1361-6439/ad3659⟩. ⟨hal-04539677⟩

• Poster de conférence

Identification de défauts pour le monitoring des rails

Elissa Akiki, Lynda Chehami, Nikolay Smagin, Emmanuel Moulin, Jamal Assaad, Youssef Zaatar

L’évaluation non destructive des rails est cruciale pour garantir une sécurité élevée dans le transport ferroviaire. On propose ici une méthode d’identification des sources de bruit et/ou défauts par apprentissage sur une base de données de référence. Des essais expérimentaux ont été effectués sur..., Non-destructive evaluation of rails is crucial to ensure high safety in rail transport. Here we propose a method for identifying sources of noise and/or defects by learning on a reference database. Experimental tests were carried out on a rail subjected to a force torque applied at different...

Mardi des Chercheurs 2024, Mar 2024, Mons, Belgique. ⟨hal-04542488⟩

• Poster de conférence

Challenges in the synthesis & optical characterization of 2D ferroelectric Ba0.85Ca0.15Ti0.9Zr0.1O3 by RF sputtering

Yusuf K Bostan, Florian Jean, Denis Remiens, Jing Hua Teng, El Hadj Dogheche

Ferroelectric materials, such as BaTiO₃ and (Ba,Ca)(Ti,Zr)O₃ (BCTZ), are essential in modern technology, thanks to their permanent electrical dipoles and unique properties like piezoelectricity. These lead-free perovskites are especially valuable, offering tunability for advanced applications such...

Mardi des Chercheurs, Mar 2024, Mons, Belgium. 2024. ⟨hal-04622518⟩

• Poster de conférence

Localisation 3D via des réseaux de capteurs en milieu électromagnétiquement perturbé: contexte de l’usine 4.0

Thomas Steve NKOLO BEKONO, Michael Bocquet, S. Baranowski

L’usine connectée, ou usine du futur, va utiliser les équipements déjà existants, les améliorer, puis les placer au cœur d’un réseau où toutes les informations pourront être échangées. Cela va mettre en évidence l’intérêt : de l’internet des objets, des robots collaboratifs (cobots), de la réalité..., The connected factory, or factory of the future, will use existing equipment, improve it and then place it at the heart of a network where all the information can be exchanged. This will highlight the benefits of the Internet of Things, collaborative robots (cobots), augmented reality, cyber...

Mardi des chercheurs, Mar 2024, Mons, Belgique. ⟨hal-04524864⟩

• Poster de conférence

Leveraging Efficient Models for Recognizing Drivers' Facial Expressions

Ibtissam Saadi, Douglas W Cunningham, Abdelmalik Taleb-Ahmed, Abdenour Hadid, Yassin El Hillali

Our new approach, ShuffViT-DFER, combines lightweight CNN and vision transformer models for efficient and accurate real-time driver facial expression recognition. By merging their features effectively, we outperform existing methods on benchmark datasets like KMU-FED and KDEF.

Mardi des chercheurs 2024, Mar 2024, mons, Belgium. ⟨hal-04546700⟩

• Poster de conférence

Amélioration de la microstructure préférentiellement orientée des vitrocéramiques STS polaires

Oussama Zwein, Maurice Gonon, Marc Duquennoy, Rıdvan Yildiz, Sandra Abdelouhab

Mardi des chercheurs 2024, Mar 2024, Mons, Belgique. ⟨hal-05063462⟩

• Poster de conférence

Leveraging Efficient Models for Recognizing Drivers' Facial Expressions

Ibtissam Saadi, Douglas W Cunningham, Abdelmalik Taleb-Ahmed, Abdenour Hadid, Yassin El Hillali

Our new approach, ShuffViT-DFER, combines lightweight CNN and vision transformer models for efficient and accurate real-time driver facial expression recognition. By merging their features effectively, we outperform existing methods on benchmark datasets like KMU-FED and KDEF.

Mardi des chercheurs 2024, Mar 2024, mons, Belgium. ⟨hal-04985694⟩

• Article dans une revue

EME-CNTK: Infinite Limits of Convolutional Neural Network for Urban Electromagnetic Field Exposure Reconstruction

Mohammed Mallik, Benjamin Allaert, E. Egea-Lopez, D.P. Gaillot, J. Wiart, L. Clavier

Electromagnetic field (EMF) exposure has grown to be a critical concern as a consequence of the ongoing installation of fifth-generation cellular networks (5G). The lack of measurements makes it difficult to accurately assess the EMF in a specific urban area, as Spectrum cartography (SC) relies on...

IEEE Access, 2024, 12, pp.49476-49488. ⟨10.1109/ACCESS.2024.3380835⟩. ⟨hal-04537011⟩

• Article dans une revue

Design and testing of a multi-electrode apodized acousto-optic filter for arbitrary polarized light

Samuel Dupont, Jean-Claude Kastelik, Jurgen Vanhamel

We present an original acousto-optic tunable filter that is able to filter visible light from 400 to 650 nm and is designed to interact simultaneously with two polarizations. The filter shows an adjustable optical bandwidth and apodization capabilities. These features make it suitable for practical...

Applied optics, 2024, 63 (10), pp.2487. ⟨10.1364/AO.514229⟩. ⟨hal-04516407⟩

• Article dans une revue

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Johannes Hoffmann, Sophie de Préville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Theron, Georg Gramse, Damien Richert, José Morán-Meza, François Piquemal

In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration,..., Cet article donne une définition du gain et du bruit ajouté par les circuits d'adaptation d'impédance utilisés pour la microscopie en champ proche en hyperfréquences. Cette définition peut être utilisée pour comparer différentes techniques d'adaptation d'impédance indépendamment...

IEEE Transactions on Instrumentation and Measurement, 2024, 73 (6), pp.6006109. ⟨10.1109/TIM.2024.3378310⟩. ⟨hal-04779337⟩