Publicaciones
Affichage de 15151 à 15160 sur 16064
Mechanical properties of thin film materials for the 2D numerical analysis of deep submicron CMOS technologies
V. Senez, G. Carlotti, I. de Wolf, R. Balboni, A. Benedetti, D. Piccolo, G. Mastracchio
Proceedings of the 2001 Material Research Society Fall Meeting, 2001, Boston, MA, United States. ⟨hal-00152221⟩
Theoretical analysis of the density of states and phase times: Application to resonant electromagnetic modes in finite superlattices
M. Lahlaouti, Abdellatif Akjouj, B. Djafari-Rouhani, Leonard Dobrzynski, M. Hammouchi, E. El Boudouti, A. Nougaoui, B. Kharbouch
Physical Review B, 2001, 63 (3), pp.035312. ⟨10.1103/PhysRevB.63.035312⟩. ⟨hal-04069647⟩
AlGaN/GaN based MOSHFETs with Different Gate Dielectrics and Treatments
D. Mistele, Zahia Bougrioua, T. Rotter, I. Moerman, K.S. Röver, M. Seyboth, V. Schwegler, J. Stemmer, F. Fedler, H. Klausing, O.K. Semchinova, J. Aderhold, J. Graul
MRS Online Proceedings Library, 2001, 693, ⟨10.1557/PROC-693-I6.51.1⟩. ⟨hal-02906500⟩
Liquid crystals applications to R.F. and microwave tunable components
Bertrand Splingart, Nicolas Tentillier, Fabrice Huret, Christian Legrand
The 18th International Liquid Crystal Conference - ILCC 2000, Jul 2000, Sendaï, Japan. pp.183-190, ⟨10.1080/10587250108029945⟩. ⟨hal-00158622⟩
Contribution à la caractérisation de transistors à effet de champ hyperfréquences pour l'amplification de puissance
Christophe Gaquière
2001. ⟨hal-00152907⟩
Système de mesure NPR pour caractérisation non linéaire de transistors et circuits en bande Ka
Pascal Delemotte, Frédéric Bue-Erkmen, Christophe Gaquière, Yves Crosnier
Actes des 12èmes Journées Nationales Microondes, JNM 2001, May 2001, Poitiers, France. ⟨hal-00152656⟩
New developments on IR distribution-patterned microradiometers family
Didier Leclercq, Katir Ziouche, Mohamed Boutchich, Pascale Godts
SPIE 15th Annual International Symposium on Aerospace/Defense Sensing, Simulation and Controls, Infrared Technology and Applications, AeroSense 2001, Apr 2001, Orlando, United States. pp.389-396, ⟨10.1117/12.445333⟩. ⟨hal-00152188⟩
Méthode de mesure de l'absorptivité différentielle de 2 matériaux. Application en UV et IR
Katir Ziouche, Mohamed Boutchich, Pascale Godts, Didier Leclercq
Conférence Métrologie 2001, 2001, Saint Louis, France. ⟨hal-00152207⟩
Combined polarizing interferometer and optical beam deflection system for MEMS characterization
D.F.L. Jenkins, W.W. Clegg, X. Liu, G. Tunstall, Eric Cattan, Denis Remiens, B. Liu
2001, pp.15-25. ⟨hal-00152485⟩