Publicaciones

Affichage de 6301 à 6310 sur 16164


  • Communication dans un congrès

Flexible real-time MIMO channel sounder for multidimensional polarimetric parameter estimation

Pierre Laly, Davy Gaillot, M Lienard, Pierre Degauque, E Tanghe, W Joseph, L Martens

2015 IEEE Conference on Antenna Measurements & Applications, CAMA 2015, Nov 2015, Chiang Mai, Thailand. ⟨10.1109/CAMA.2015.7428142⟩. ⟨hal-03346253⟩

  • Article dans une revue

Thermal characterization using optical methods of AlGaN/GaN HEMTs on SiC substrate in RF operating conditions

Leny Baczkowski, Jean-Claude Jacquet, Olivier Jardel, Christophe Gaquière, myriam moreau, Dominique Carisetti, Laurent Brunel, Franck Vouzelaud, Yves Mancuso

Performance and reliability of wide bandgap high-power amplifiers are correlated with their thermal behavior. Thermal model development and suitable temperature measurement systems are necessary to quantify the channel temperature of devices in real operating conditions. As a direct temperature...

IEEE Transactions on Electron Devices, 2015, 62, pp.3992 - 3998. ⟨10.1109/TED.2015.2493204⟩. ⟨hal-01348823⟩

  • Article dans une revue

Reaching the quantum limit of sensitivity in electron spin resonance

A Bienfait, Y Kubo, M Stern, Xin Zhou, T Schenkel, D Vion, D Esteve, B Julsgaard, K Mølmer, P. Bertet, J;j. Pla, C.C. Lo, J.J.L. Morton

The detection and characterization of paramagnetic species by electron spin resonance (ESR) spectroscopy is widely used throughout chemistry, biology and materials science 1 , from in vivo imaging 2 to distance measurements in spin-labelled proteins 3. ESR relies on the inductive detection of...

Nature Nanotechnology, 2015, 11, pp.253-257. ⟨10.1038/NNANO.2015.282⟩. ⟨cea-01366689⟩

  • Article dans une revue

Source-Pull and Load-Pull Characterization of Graphene FET

Sebastien Fregonese, Magali de Matos, David Mele, Cristell Maneux, Henri Happy, Thomas Zimmer

IEEE Journal of the Electron Devices Society, 2015, 3 (1), pp.99. ⟨10.1109/JEDS.2014.2360408⟩. ⟨hal-01090826⟩

  • Communication dans un congrès

Measurement Accuracy and Repeatability in Near-Field Scanning Microwave Microscopy

S. Gu, Kamel Haddadi, A. El Fellahi, Gilles Dambrine, T. Lasri

We report on the accuracy and repeatability tests for near-field scanning microwave microscopy applications by associating a network analyzer and an evanescent microwave probe (EMP). A broadband matching network based on an interferometric technique is used to achieve a strong electromagnetic...

IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, IEEE, May 2015, Pisa, Italie. pp.1735-1740, ⟨10.1109/I2MTC.2015.7151542⟩. ⟨hal-03224665⟩