Publications

Affichage de 10111 à 10120 sur 16549


  • Article dans une revue

Fabrication and investigation of 1D and 2D structures in LiNbO3 thin films by pulsed laser ablation

F. Mériche, A. Boudrioua, R. Kremer, El Hadj Dogheche, E. Neiss-Clauss, R. Mouras, A. Fischer, M.-R. Beghoul, E. Fogarassy, N. Boutaoui

Optical Materials, 2010, 32 (11), pp.1427-1434. ⟨10.1016/j.optmat.2010.05.010⟩. ⟨hal-00512035⟩

  • Article dans une revue

Computer simulation of disordered structures and nanosystems : an atomic-scale view

C. Massobrio, F. Cleri, R. Kozubski

Solid State Sciences, 2010, 12, pp.155-156. ⟨10.1016/j.solidstatesciences.2010.01.016⟩. ⟨hal-00549045⟩

  • Article dans une revue

Two-dimensional simulation of the single-sided air-coupled ultrasonic pitch-catch technique for non-destructive testing

S. Delrue, K. van den Abeele, E. Blomme, J. Deveugele, P. Lust, Olivier Bou Matar

Ultrasonics, 2010, 50, pp.188-196. ⟨10.1016/j.ultras.2009.08.005⟩. ⟨hal-00549561⟩

  • Communication dans un congrès

Towards cell characterization by THz BioMEMS

Simon Laurette, A. Treizebre, Nour Eddine Bourzgui, Bertrand Bocquet

Journées Nationales Communes du GDR Micro et Nano Fluidique et du Club Micro Capteurs Chimiques, 2010, Villeneuve d'Ascq, France. ⟨hal-00574491⟩

  • Article dans une revue

Piezoelectric-actuated, piezoresistive-sensed circular micromembranes for label-free biosensing applications

Thomas Alava, Fabrice Mathieu, P. Rameil, Y. Morel, Caroline Soyer, Denis Remiens, Liviu Nicu

Applied Physics Letters, 2010, 97, pp.093703-1-3. ⟨10.1063/1.3486112⟩. ⟨hal-00567894⟩

  • Article dans une revue

Characterization of ytterbium silicide formed in ultra high vacuum

Adam Laszcz, Jacek Ratajczak, Andrzej Czerwinski, Jerzy Katcki, Vesna Srot, Fritz Phillipp, Peter A. van Aken, Dmitri Yarekha, Nicolas Reckinger, Guilhem Larrieu, Emmanuel Dubois

The formation of ytterbium silicide fabricated by annealing at 480 °C for one hour has been studied by means of high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The annealing process has been performed under ultra high vacuum (UHV) conditions…

Journal of Physics: Conference Series, 2010, 209 : 16th International Conference on Microscopy of Semiconducting Materials, pp.012056 (1--4). ⟨10.1088/1742-6596/209/1/012056⟩. ⟨hal-00549559⟩

  • Communication dans un congrès

Cascaded acousto-optical deflectors for optical trapping

Jean-Claude Kastelik, Samuel Dupont, Michel Pommeray, Joseph Gazalet

European Optical Society Annual Meeting, EOSAM 2010, 2010, Paris, France. pp.TOM1_3455_07, 101-102. ⟨hal-00800864⟩