Publications
Affichage de 11751 à 11760 sur 16566
Calibration and performance of two new ultra-wideband four-port-based systems
Kamel Haddadi, M.M. Wang, K. Nouri, D. Glay, T. Lasri
IEEE Transactions on Microwave Theory and Techniques, 2008, 56, pp.3137-3142. ⟨10.1109/TMTT.2008.2007138⟩. ⟨hal-00356992⟩
Magnon nanometric multiplexers in quasi-one-dimensional cluster chains
Housni Al-Wahsh, Bahram Djafari-Rouhani, L. Dobrzynski, Abdellatif Akjouj
Surface Science : A Journal Devoted to the Physics and Chemistry of Interfaces, 2008, 602, pp.1795-1802. ⟨10.1016/j.susc.2008.03.015⟩. ⟨hal-00357368⟩
Inverse method for determining of permittivity in inhomogeneous materials
M. Bouhorma, A. Ghammaz, A. Mamouni, S. Lefeuvre
Ferroelectrics, 2008, 372, pp.100-106. ⟨10.1080/00150190802382033⟩. ⟨hal-00356991⟩
Unified and stable scattering matrix formalism for acoustic waves in piezoelectric stacks
Victor Y. Zhang, Vincent Laude
Second ASA-EAA Joint Conference, ACOUSTICS'08, Jul 2008, Paris, France. pp.5957-5962, ⟨10.1121/1.2935657⟩. ⟨hal-00343688⟩
The answer to the challenging question : is there any limit size of nanowires ?
D. Hourlier, P. Perrot
Journal of Nano Research, 2008, 4, pp.135-144. ⟨10.4028/www.scientific.net/JNanoR.4.135⟩. ⟨hal-00376227⟩
Negative refraction of transverse waves in an elastic phononic crystal
Anne-Christine Hladky, Jerome O. Vasseur, Bertrand Dubus, Bahram Djafari-Rouhani, B. Morvan, A. Tinel, D. Ekeom
2008 IEEE International Ultrasonics Symposium, 2008 IEEE IUS, 2008, China. pp.253-256, ⟨10.1109/ULTSYM.2008.0062⟩. ⟨hal-00375182⟩
Thermoelastic FEM-BEM model for solidly mounted resonator
D. Ekeom, Bertrand Dubus
IEEE International Ultrasonics Symposium, 2008 IEEE IUS, 2008, China. pp.1564-1567, ⟨10.1109/ULTSYM.2008.0381⟩. ⟨hal-00375169⟩
Comparison between 60-GHz UWB frequency modulation and UWB impulse-radio location systems
Michael Bocquet, N. Obeid, Christophe Loyez, C. Lethien, Fouzia Boukour, N. Rolland, M. Heddebau
5th European Radar Conference, EuRAD 2008, 2008, Netherlands. pp.41-43. ⟨hal-00362374⟩
Picosecond ultrasonics : the prefered tool for BAW characterization
P. Emery, Arnaud Devos, P. Ancey
IEEE International Ultrasonics Symposium, 2008 IEEE IUS, 2008, China. pp.2205-2208, ⟨10.1109/ULTSYM.2008.0546⟩. ⟨hal-00375167⟩
Characterization of silicon nitride thin films used as stressor liners on CMOS FETs
G. Raymond, Pascal Morin, Arnaud Devos, D.A. Hess, M. Braccini, F. Volpi
9th International Conference on Ultimate Integration of Silicon, ULIS 2008, 2008, Italy. pp.199-202, ⟨10.1109/ULIS.2008.4527173⟩. ⟨hal-00360388⟩