Publications

• Communication dans un congrès

A DCT-domain postprocessor for color bleeding removal

François-Xavier Coudoux, Marc G. Gazalet, Patrick Corlay

2005, pp.I-209. ⟨hal-00131105⟩

• Communication dans un congrès

Novel dual-mode locking semiconductor laser for millimetre-wave generation

P. Acedo, C. Roda, H. Lamela, G. Carpintero, Jean-Pierre Vilcot, S. Garidel

2005, pp.59580V-1-9. ⟨hal-00130833⟩

• Communication dans un congrès

Comparative study for LAN using POF and silica fibre

C. Lethien, A. Goffin, Jean-Pierre Vilcot, Christophe Loyez

NEFERTITI Workshop on Millimetre Wave Photonic Devices and Technologies for Wireless and Imaging Applications, 2005, Bruxelles, Belgium. ⟨hal-00130837⟩

• Communication dans un congrès

Dual-wavelength multimode fibre transmission of digital and RF signals

C. Sion, A. Roche, A. da Costa, C. Lethien, Christophe Loyez, Jean-Pierre Vilcot, R. Hamelin

12th European NEFERTITI Workshop on Photonics and Wireless Communications - Cost Effective and Future Applications, 2005, Göteborg, Sweden. ⟨hal-00130842⟩

• Communication dans un congrès

Enhancement of cutoff frequency in AlGaN/GaN high electron mobility transistors using a silicon nitride based T-gate technology

S. Touati, Virginie Hoel, A. Soltani, Jean-Claude de Jaeger, M.A. Poisson, S. Delage

Proceedings of the 16th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes and Nitrides, Diamond 2005, 2005, Toulouse, France. ⟨hal-00131349⟩

• Communication dans un congrès

Performances of concatenated coded OFDM over propagation channels suitable for high speed trains

M. Chennaoui, Marion Berbineau, Jamal Assaad, Atika Rivenq

Proceedings of the 5th International Conference on ITS Telecommunications, ITST-2005, 2005, Brest, France. ⟨hal-00131358⟩

• Ouvrages

Group-IV Semiconductor Nanostructures - Materials Research Society 2004 Fall Symposium Proceedings, volume 832

L. Tsybeskov, D.J. Lockwood, C. Delerue, M. Ichikawa

Materials Research Society, Warrendale, PA, USA, pp.F1.1 - F11.8, 2005. ⟨hal-00131730⟩

• Communication dans un congrès

High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC

Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone

It is becoming more and more difficult to ensure robust patterning after OPC due to the continuous reduction of layout dimensions and diminishing process windows associated with each successive lithographic generation. Lithographers must guarantee high imaging fidelity throughout the entire range…

2005, pp.1750-1761. ⟨hal-00023223⟩

• Communication dans un congrès

Conception d'amplificateurs distribués en bande K avec une technologie CMOS SOI partiellement désertée 130 nm

C. Pavageau, M. Si Moussa, A. Siligaris, L. Picheta, Francois Danneville, J.P. Raskin, D. Vanhoenacker-Janvier, J. Russat, N. Fel

Actes des 14èmes Journées Nationales Microondes, 2005, Nantes, France. ⟨hal-00247447⟩

• Communication dans un congrès

Fuzzy logic modelling of electrical properties – PANI/Dyneema® conductive fibres

B. Kim, V. Koncar, C. Dufour

5th World Textile Conference, AUTEX 2005, 2005, Portorož, Slovenia. ⟨hal-00247654⟩