Publications

• Communication dans un congrès

Magneto-optical study TbCo/FeCo nanostructured thin films

A. Klimov, S. Masson, Vladimir Preobrazhensky, Philippe Pernod, Nicolas Tiercelin

Proceedings of the 2005 International Conference on Functional Materials, ICFM'2005, 2005, Crimea, Ukraine. ⟨hal-00138854⟩

• Communication dans un congrès

Optimisation of HSQ e-beam lithography for the patterning of FinFET transistors

F. Fruleux, J. Penaud, Emmanuel Dubois, M. Francois, M. Muller

2005, pp.9C01. ⟨hal-00138404⟩

• Communication dans un congrès

Impact of the intrinsic parameters of the dielectric on the leakage current

G. Larrieu, M. Tao

2nd International Workshop on Advanced Gate Stack Technology, 2005, Austin, TX, United States. ⟨hal-00138407⟩

• Autre publication scientifique

Conception et réalisation de systèmes en gamme millimétrique pour l'évaluation non destructive : application à la restauration de profils et d'images d'objets enfouis

M. Maazi

2005. ⟨hal-00138433⟩

• Article dans une revue

High mobility InGaAs/InAlAs pseudomorphic heterostructures on InP(001)

X. Wallart, B. Pinsard, F. Mollot

Journal of Applied Physics, 2005, 97, pp.053706-1-6. ⟨hal-00125384⟩

• Article dans une revue

Voltage tunable terahertz emission from a ballistic nanometer InGaAs/InAlAs transistor

J. Lusakowski, W. Knap, N. Dyakonova, L. Varani, J. Mateos, T. Gonzales, Yannick Roelens, S. Bollaert, A. Cappy, K. Karpierz

Journal of Applied Physics, 2005, 97, pp.64307-1-7. ⟨hal-00125162⟩

• Article dans une revue

Interferometric detection of acoustic waves at air-solid interface – Applications to non-destructive testing

Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak

Journal of Applied Physics, 2005, 97, pp.094905-1-8. ⟨hal-00140391⟩

• Article dans une revue

Model for ferroelectric semiconductors thin films accounting for the space varying permittivity

Laurent Baudry, Jérôme Tournier

Reducing thickness of ferroelectric films typically comes with an apparent degradation of their ferroelectric and dielectric properties. The existence of low-dielectric interfacial layers is often invoked to explain such behaviors. Much work has been done on modeling ferroelectric thin films by…

Journal of Applied Physics, 2005, 97, pp.024104. ⟨10.1063/1.1834728⟩. ⟨hal-00125348⟩

• Article dans une revue

Biaxial initial stress characterization of bilayer gold RF-switches

K. Yacine, F. Flourens, David Bourrier, Ludovic Salvagnac, P. Calmont, X. Lafontan, Q.H. Duong, L. Buchaillot, D. Peyrou, Patrick Pons, Robert Plana

Microelectronics Reliability, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩. ⟨hal-00128652⟩

• Communication dans un congrès

Organic field effect transistor based on a novel soluble pentacene precursor and operating at low voltages

D. Zander, N. Hoffmann, K. Lmimouni, S. Lenfant, C. Petit, D. Vuillaume

14th Biennial Conference on Insulating Films on Semiconductors, 2005, Belgium. pp.394-397, ⟨10.1016/j.mee.2005.04.096⟩. ⟨hal-00247650⟩