Publications
Affichage de 13631 à 13640 sur 16109
An original methodology to assess fatigue behavior in RF MEMS devices
O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot
European Microwave Week, 2004, Amsterdam, Netherlands. ⟨hal-00141031⟩
Simulation, conception et réalisation d'un commutateur en technologie microsystème pour dispositifs logiques sécuritaires
F. Conseil
2004. ⟨hal-00141010⟩
Remote powering of intelligent microsystems
Philippe Basset, L. Buchaillot, A. Kaiser
VALLE M. Smart adaptive systems on silicon, Kluwer Academic Publishers, pp.253-268, 2004. ⟨hal-00137232⟩
Eléments de microfluidique EWOD en technologie multi-matériaux pour microsystème à vocation biologique
F. Caron, J.C. Fourrier, Julien Carlier, V. Thomy, J.C. Camart, C. Druon, P. Tabourier
Actes du 2ème Congrès Français de Microfluidique, 2004, Toulouse, France. ⟨hal-00142068⟩
Semi-blind estimation in a DMT-based transmission on indoor power line
Virginie Degardin, M. Lienard, Pierre Degauque
2004, pp.195-199. ⟨hal-00142017⟩
One-dimensional reconstruction of a defect profile based on millimeter-wave nondestructive techniques
M. Maazi, D. Glay, T. Lasri
Microwave and Optical Technology Letters, 2004, 43, pp.133-138. ⟨hal-00133929⟩
Etude et réalisation de photodiodes-guides millimétriques de puissance à 1,5 microns
N. Michel
2004. ⟨hal-00141172⟩
Conductivity of DNA probed by conducting-atomic force microscopy : effects of contact electrode, DNA stucture and surface interactions
T. Heim, D. Deresmes, Dominique Vuillaume
Journal of Applied Physics, 2004, 96, pp.2927-2936. ⟨10.1063/1.1769606⟩. ⟨hal-00140730⟩
Aluminum, oxide and silicon phonons by IETS on MOS tunnel junctions : accurate determination and effect of electrical stress
C. Petit, G. Salace, D. Vuillaume
Journal of Applied Physics, 2004, 96, pp.5042-5049. ⟨hal-00140733⟩
High resolution seismic imaging as an efficient tool for shallow subsurface survey : case studies
Bogdan Piwakowski
1st General Assembly of the European Geosciences Union, 2004, France. pp.EGU04-A-03836. ⟨hal-00247804⟩