Publications

Affichage de 16051 à 16060 sur 16252


  • Article dans une revue

Microscopic noise modeling and macroscopic noise models: how good a connection? [FETs]

Francois Danneville, Henri Happy, Gilles Dambrine, J.-M. Belquin, A. Cappy

  • Article dans une revue

Temperature measurements of LT GaAs diodes

R. Westphalen, B. Boudart, Didier Theron, X. Wallart, Y. Druelle, Y. Crosnier

Materials Science and Engineering: B, 1993, 22 (1), pp.78 - 81. ⟨10.1016/0921-5107(93)90227-E⟩. ⟨hal-01647734⟩

  • Communication dans un congrès

Efficient scaling of MOSFETS in the 50 nm regime using a recessed channel

Emmanuel Dubois, Bricout Paul-Henri

International Symposium Semiconductor Device Research (ISDRS), Dec 1993, Charlottesville (Virginia), United States. ⟨hal-04248357⟩

  • Communication dans un congrès

Theory of rare-earth impurities in semiconductors

Christophe Delerue, Michel Lannoo, Guy Allan

MRS Fall Meeting, Nov 1993, Boston, United States. ⟨hal-03316843⟩

  • Article dans une revue

Acoustic resonances of adsorbed wires and channels

B Djafari-Rouhani, Leonard Dobrzynski

Journal of Physics: Condensed Matter, 1993, 5 (44), pp.8177-8194. ⟨10.1088/0953-8984/5/44/010⟩. ⟨hal-04070088⟩

  • Communication dans un congrès

Study of acoustic signatures for non-spherical curved acoustic lens

Wei-Jiang Xu, Mohamed Ourak, Mohammadi Ouaftouh, Bertrand Nongaillard

In this paper, we first evaluate the Acoustical Material Signature used in acoustic microscopy by a method based on the Rayleigh-Sommefeld field integration. Different to the conventional geometry ray or Fourier optics method the field integration method needs no approximate conditions and can take…

Proceedings of IEEE Ultrasonics Symposium ULTSYM-94, Oct 1993, Cannes, France. pp.1413-1416 vol.3, ⟨10.1109/ultsym.1994.401856⟩. ⟨hal-03811459⟩

  • Article dans une revue

Surface and interface elastic waves in superlattices: Transverse localized and resonant modes

E. El Boudouti, B. Djafari-Rouhani, E. Khourdifi, Leonard Dobrzynski

Physical Review B, 1993, 48 (15), pp.10987-10997. ⟨10.1103/PhysRevB.48.10987⟩. ⟨hal-04069551⟩

  • Communication dans un congrès

Influence of the gate leakage current on the noise performance of MESFETs and MODFETs

Francois Danneville, Gilles Dambrine, H. Happy, A. Cappy

1993 IEEE MTT-S International Microwave Symposium Digest, Jun 1993, Atlanta, United States. pp.373-376 vol.1, ⟨10.1109/mwsym.1993.276800⟩. ⟨hal-03317746⟩