Publications

Affichage de 5481 à 5490 sur 16170


  • Communication dans un congrès

Caractérisation des changements d'état d'un milieu agroalimentaire par mesures de décorrélation de coda ultrasonore

Bowei Chen, Emmanuel Moulin, Pierre Campistron, Dorothée Debavelaere-Callens

8ème Edition Franco-Belge du Mardi des Chercheurs, MdC 2017, Mar 2017, Mons, Belgique. ⟨hal-03572138⟩

  • Communication dans un congrès

Vibrating wings conception for an insect-like nano-drone

Damien Faux, Olivier Thomas, Eric Cattan, Sébastien Grondel

8ème Edition Franco-Belge du Mardi des Chercheurs, MdC 2017, Mar 2017, Mons, Belgium. ⟨hal-04086663⟩

  • Communication dans un congrès

Modeling of ultrasonic reflection/transmission in a multilayered liquid-solid-porous viscoelastic structure

Sandrine Matta, Wei-Jiang Xu, Georges Nassar, Antoine Abche

8ème Edition Franco-Belge du Mardi des Chercheurs, MdC 2017, Mar 2017, Mons, Belgium. ⟨hal-03572156⟩

  • Article dans une revue

Fourier-like conduction and finite one-dimensional thermal conductivity in long silicon nanowires by approach-to-equilibrium molecular dynamics

Hayat Zaoui, Pier Luca Palla, Fabrizio Cleri, Évelyne Martin

Physical Review B, 2017, 95 (10), 104309, 7 p. ⟨10.1103/PhysRevB.95.104309⟩. ⟨hal-03407494⟩

  • Article dans une revue

Anomalous DC and RF behavior of virgin AlGaN/AlN/GaN HEMTs

Hector Sanchez-Martin, Oscar Garcia-Perez, Susana Pérez, Philippe Altuntas, Virginie Hoel, Stephanie Rennesson, Yvon Cordier, Tomás González, Javier Mateos, Ignacio Íñiguez-De-La-Torre

The performance of gallium nitride transistors is still limited by technological problems often related to defects and traps. In this work, virgin AlGaN/AlN/GaN HEMTs exhibiting an anomalous DC behavior accompanied by frequency dispersion in the microwave range, both in the transconductance and…

Semiconductor Science and Technology, 2017, 32 (3), 035011, 8 p. ⟨10.1088/1361-6641/aa5473⟩. ⟨hal-03270095⟩

  • Article dans une revue

Modeled optical properties of SiGe and Si layers compared to spectroscopic ellipsometry measurements

C. Kriso, F. Triozon, C. Delerue, L. Schneider, F. Abbate, E. Nolot, D. Rideau, Y.-M. Niquet, G. Mugny, C. Tavernier

Solid-State Electronics, 2017, 129, pp.93-96. ⟨10.1016/j.sse.2016.12.011⟩. ⟨hal-02906816⟩