Publications

Affichage de 6041 à 6050 sur 16058


  • ART

Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs

S. Petitdidier, F. Berthet, Y. Guhel, J.L. Trolet, P. Mary, Christophe Gaquière, B. Boudart

Microelectronics Reliability, 2015, 55 (9-10), pp.1719 - 1723. ⟨10.1016/j.microrel.2015.06.070⟩. ⟨hal-01646909⟩

  • ART

High structural quality InGaN/GaN multiple quantum well solar cells

Ezgi Dogmus, Malek Zegaoui, Ludovic Largeau, Maria Tchernycheva, Vladimir Neplokh, Saskia Weiszer, Fabian Schuster, Martin Stutzmann, Martin Foldyna, F Medjdoub

Physica Status Solidi C: Current Topics in Solid State Physics, 2015, ⟨10.1002/pssc.201510137⟩. ⟨hal-01230121⟩

  • ART

Pulmonary Scintigraphy for the Diagnosis of Acute Pulmonary Embolism: A Survey of Current Practices in Australia, Canada, and France.

Pierre-Yves Le Roux, Matthieu Pelletier-Galarneau, Romain de Laroche, Michael S Hofman, Lionel S Zuckier, Paul Roach, Jean-Philippe Vuillez, Rodney J Hicks, Grégoire Le Gal, Pierre-Yves Salaun

There are currently no data published regarding the proportion of nuclear medicine centers using SPECT or SPECT/CT rather than planar ventilation/perfusion (V/Q) imaging in patients with suspected acute pulmonary embolism (PE). Furthermore, the reporting criteria used for interpretation of both…

Journal of Nuclear Medicine, 2015, 56 (8), pp.1212-7. ⟨10.2967/jnumed.115.157743⟩. ⟨hal-01275209⟩

  • ART

Mechanically robust, electrically stable metal arrays on plasma-oxidized polydimethylsiloxane for stretchable technologies

Rian Seghir, S. Arscott

Journal of Applied Physics, 2015, 118 (4), pp.045309. ⟨10.1063/1.4927616⟩. ⟨hal-02345538⟩

  • COMM

Development of flexible SAW sensors for non-destructive testing of structure

Rafatou Takpara, Marc Duquennoy, Christian Courtois, Maurice Gonon, Mohammadi Ouaftouh, Gregory Martic, Mohamed Rguiti, Frédéric Jenot, Laurent Seronveaux, Christine Pelegris

42nd Annual Review of Progress in Quantitative Nondestructive Evaluation, QNDE 2015, Jul 2015, Minneapolis, United States. ⟨hal-03586624⟩

  • COUV

Automated System-Level Design for Reliability : RF front-end application

Pietro Maris Ferreira, Jack Ou, Christophe Gaquière, Philippe Benabes

Reliability is an important issue for safety operation of circuits in critical applications such as military, aerospace, energy, and biomedical engineering. With the rise of failure rate in nanometer CMOS technologies, the need for reliability has become more pressing in the recent years. General…

Mourad Fakhfakh, Esteban Tlelo-Cuautle, Patrick Siarry. Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design, Springer International Publishing, 2015, ⟨10.1007/978-3-319-19872-9_13⟩. ⟨hal-01222066⟩