Publications

• Communication dans un congrès

Near-field microscopy : from MIR to THz

Gabriel Moreno, Antoine Pagies, Damien Ducatteau, Nicolas Clément, Tahsin Akalin, Mathias Vanwolleghem, Jean-Francois Lampin

joint 25th Conference of the Condensed Matter Division of the European Physical Society, and 14èmes Journées de la Matière Condensée, CMD25-JMC14, 2014, Paris, France. 2 p. ⟨hal-01015277⟩

• Communication dans un congrès

Engineering of oxide based resistive switching for neuromorphic computing

F. Alibart, Selina La Barbera, G. Sassine, N. Najjari, Dominique Vuillaume

Journées Nationales du GdR OXYFUN " Oxydes fonctionnels : du matériau au dispositif ", 2014, Autrans, France. ⟨hal-01055005⟩

• Communication dans un congrès

Ferroelectric thin films working at microwave frequency for reconfigurable devices on silicon substrate: performances comparison between BST, PST

Freddy Ponchel, Denis Remiens, Areski Ghalem, Tuami Lasri

4th International Meeting on Dielectric Materials, May 2013, Marrakech, Morocco. ⟨hal-03659197⟩

• Communication dans un congrès

Polyaniline-carbon nanotubes composites - Based patch antenna

Z. Hamouda, J.-L. Wojkiewicz, A.A. Pud, B. Belaabed, S. Bergheul, T. Lasri

This paper presents the simulation and realization of a patch antenna made of composites based on Polyaniline (PANI) and carbon nanotubes (CNT). The antenna is designed to work at the frequency of 4.5 GHz; the dielectric substrates used is Rogers RT/duroid 5870 which has a dielectric permittivity…

8th European Conference on Antennas and Propagation, EuCAP 2014, Apr 2014, The Hague, Netherlands. pp.2197-2200, ⟨10.1109/EuCAP.2014.6902246⟩. ⟨hal-03538366⟩

• Article dans une revue

Back cover

S. Arscott

Lab on a Chip, 2014, 14 (19), pp.3896. ⟨10.1039/C4LC90090A⟩. ⟨hal-02345645⟩

• Communication dans un congrès

[Invited] 3D substrates for improved performance of Li-ion microbatteries

Etienne Eustache, Olivier Crosnier, Pascal Tilmant, Laurence Morgenroth, Pascal Roussel, Nathalie Rolland, Christophe Lethien, Thierry Brousse

10th Japan-France Joint Seminar on Battery, 2014, Hakone, Japan. ⟨hal-01044691⟩

• Communication dans un congrès

1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria

Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for nanodevices characterization. In recent publications, SMM has demonstrated high…

12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS), Jun 2014, Trois-Rivieres, Canada. pp.385-388. ⟨hal-03224670⟩

• Article dans une revue

Elastic properties of tensile nitrogen-plasma-treated multilayer silicon nitride films

M. Braccini, F. Volpi, Arnaud Devos, G. Raymond, D. Benoit, Pascal Morin

Highly stressed silicon nitride thin films are used in gate first complementary metal oxide semiconductors to improve mobility in the silicon channel. Compressive stresses improve hole mobility in p-type MOS transistors while tensile stresses increase electron mobility in n-type MOS devices. High…

Thin Solid Films, 2014, 551, pp.120-126. ⟨10.1016/j.tsf.2013.11.012⟩. ⟨hal-00925380⟩

• Article dans une revue

1 to 220 GHz complex permittivity behavior of flexible polydimethylsiloxane substrate

Pierre-Yves Cresson, Yovan Orlic, Jean-François Legier, Erick Paleczny, Luc Dubois, Nicolas Tiercelin, Philippe Coquet, Philippe Pernod, Tuami Lasri

Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those…

IEEE Microwave and Wireless Components Letters, 2014, 24 (4), pp.278-280. ⟨10.1109/LMWC.2013.2295230⟩. ⟨hal-00980037⟩

• Communication dans un congrès

Etude de l'influence de la pointe sur les mesures KFM sur échantillon d'AlGaAs/GaAs

Sylvain Pouch, Nicolas Chevalier, Denis Mariolle, François Triozon, Thierry Melin, Lukasz Borowik

La microscopie à sonde de Kelvin (KFM) est capable de fournir une mesure résolue spatialement et en énergie de la structure de bande en surface d'un matériau. Elle dépend néanmoins fortement des propriétés physiques de la pointe utilisée, propriétés pouvant être la largeur de l'apex, la…

17ème Forum des Microscopies à Sonde Locale, 2014, Montauban, France. session 11, papier P-30, 175-176. ⟨hal-00974535⟩