Publications

• Communication dans un congrès

Approach-to-equilibrium molecular dynamics to study thermal transport

Evelyne Lampin, Pier Luca Palla, Pierre-Arnaud Francioso, Fabrizio Cleri

We study thermal transport properties by conduction using molecular dynamics simulations. In our approach, two portions are delimited and heated at two different temperatures before the approach-to-equilibrium in the whole structure is monitored. The observed decay of the temperature difference is…

Materials Research Society Fall Meeting, MRS Fall 2013, Symposium UU : Phonon-Interaction-Based Materials Design - Theory, Experiments and Applications, 2013, Boston, MA, United States. ⟨hal-00944024⟩

• Communication dans un congrès

Electrical tunability of AlN elastic constants : direct measurement by ultrafast acoustics

Arnaud Devos, P. Emery, E. Defay

IEEE International Ultrasonics Symposium, IUS 2013, 2013, Prague, Czech Republic. ⟨hal-00944049⟩

• Communication dans un congrès

Impact of the deposition process on the elastic properties of thin films measured by ultrafast acoustics

Arnaud Devos, A. Le Louarn, P. Emery

IEEE International Ultrasonics Symposium, IUS 2013, 2013, Prague, Czech Republic. ⟨hal-00944053⟩

• Communication dans un congrès

Experimental and theoretical investigation of guided acoustic wave properties in in-plane c-axis ZnO films

S. Takayanagi, Abdelkrim Talbi, Olivier Bou Matar, Nicolas Tiercelin, M. Matsukawa, Philippe Pernod, V.L. Preobrazhensky

IEEE International Ultrasonics Symposium, IUS 2013, 2013, Prague, Czech Republic. ⟨hal-00944039⟩

• Pré-publication, Document de travail

Modelling of Silicon Oxynitridation by Nitrous Oxide using the Reaction Rate Approach, Modélisation de l'oxynitridation du silicium via l'oxyde nitreux par une méthode cinétique reactionnelle

Christophe Dominique Krzeminski

<div><p>Large technological progress in oxynitridation processing leads to the introduction of silicon oxynitride as ultra-thin gate oxide. On the theoretical side, few studies have been dedicated to the process modelling of oxynitridation. Such an objective is a considerable challenge…

2013. ⟨hal-05690606⟩

• Communication dans un congrès

[Invited] Pattern classification by memristive crossbar circuits with ex-situ and in-situ training

F. Alibart

Workshop on Functional Oxides for Integration in Micro- and Nano-Electronics, 2013, Autrans, France. ⟨hal-00811779⟩

• Communication dans un congrès

[Invited] Micro and nano engineering of super non-wetting surfaces : from water to alcohol repellency

V. Senez

Journées Nationales sur les Technologies Emergentes en Micro-Nanofabrication, JNTE 2013, 2013, Evian, France. ⟨hal-00811828⟩

• Communication dans un congrès

Characterisation of surface residual stress using high frequency Rayleigh waves

Mohammadi Ouaftouh, Marc Duquennoy, Julien Deboucq, Frédéric Jenot, Mohamed Ourak

In order to control residual stress distribution in glass, techniques based on the phenomenon of photoelasticity are efficient, though subject to the inherent limitations of all optical techniques. To mitigate these limitations, we exploit the phenomenon of acoustoelasticity to estimate residual…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15530, 6 p. ⟨hal-00971598⟩

• Communication dans un congrès

[Invité] Etat de l'art et défis du GaN pour l'électronique

Raphaël Aubry, Yvon Cordier, Jean-Claude de Jaeger, Nicolas Grandjean, M. Rocchi, Paul-Laurent Saunier, Fabrice Semond, Jean-Guy Tartarin

14èmes Journées Nano, Micro et Optoélectronique, JNMO 2013, Table ronde, 2013, Evian, France. ⟨hal-00878877⟩

• Communication dans un congrès

Temperature dependence of the conduction mechanisms through a PZT thin film

C. Jegou, L. Michalas, T. Maroutian, G. Agnus, P. Aubert, P. Lecoeur, M. Koutsoureli, G. Papaioannou, L. Largeau, David Troadec, A. Leuliet

European Materials Research Society Spring Meeting, E-MRS Spring 2013, Symposium H - Multifunctional binary and complex oxides films and nanostructures for microelectronic applications, 2013, Strasbourg, France. ⟨hal-00819697⟩