Publications

• Article dans une revue

Leakage current, capacitance hysteresis and deep traps in Al0.25Ga0.75N/GaN/SiC high-electron-mobility transistors

S. Saadaoui, M.M. Ben Salem, O. Fathallah, M. Gassoumi, Christophe Gaquière, H. Maaref

Physica B: Condensed Matter, 2013, 412, pp.126-129. ⟨10.1016/j.physb.2012.11.031⟩. ⟨hal-00796437⟩

• Article dans une revue

Frequency and angular bandwidth of acousto-optic deflectors with ultrasonic walk-off

Jean-Claude Kastelik, Samuel Dupont, Konstantin B. Yushkov, Joseph Gazalet

Ultrasonics, 2013, 53, pp.219-224. ⟨10.1016/j.ultras.2012.06.003⟩. ⟨hal-00796423⟩

• Article dans une revue

GaAs Fabry-Perot cavity photoconductors : switching with picojoule optical pulses

Emilien Peytavit, S. Formont, Jean-Francois Lampin

Electronics Letters, 2013, 49, pp.207-208. ⟨10.1049/el.2012.3993⟩. ⟨hal-00796471⟩

• Communication dans un congrès

Scanning probe lithography as perspective tool for hypersonic surface phononic crystal fabrication

Anastasia Pavlova, Sergey Yankin

16èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2013, 2013, Grenoble, France. papier 194, 3 p. ⟨hal-00957778⟩

• Communication dans un congrès

Technology of inkjet printing applied for flexible electronics

Wei Wei, Mohamed Moez Belhaj, Henri Happy

16èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2013, Jun 2013, Grenoble, France. 3 p. ⟨hal-00957772⟩

• Communication dans un congrès

Epitaxial growth of AlN thin films at low temperature by magnetron sputtering technique

Julien Camus, Quentin Simon, Keltouma Aït Aïssa, Salma Bensalem, Laurent Le Brizoual, Gilles Tessier, Yves Scudeller, Mohamed Abdou Djouadi, Yvon Cordier, Éric Frayssinet, Jean-Claude de Jaeger, Magdalena Chmielowska, Maud Nemoz, Philippe Vennéguès, Sébastien Chenot, Nicolas Defrance, Marie Lesecq, Philippe Altuntas, Adrien Cutivet, Alain Agboton

European Materials Research Society Spring Meeting, E-MRS Spring 2013, Symposium J - Semiconductor nanostructures towards electronic and optoelectronic device applications IV, 2013, Strasbourg, France. ⟨hal-00878878⟩

• Communication dans un congrès

Study of carbon nanotubes using continuous-wave terahertz spectroscopy

S. Puthukodan, H.L. Rivera, Guillaume Ducournau, Jean-Francois Lampin

SPIE Photonics West, OPTO 2013, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications VI, 2013, San Francisco, CA, United States. ⟨hal-00878924⟩

• Chapitre d'ouvrage

Millimeter-wave characterization of silicon devices under small-signal regime : instruments and measurement methodologies

Gilles Dambrine

This chapter aims to describe experimental tools and techniques used for on-wafer millimeter (mm)-wave characterizations of silicon-based devices under the small-signal regime. We discuss the basics of scattering parameters (S parameters), high-frequency (HF) noise concept and measurement…

Crupi G., Schreurs D.M. Microwave de-embedding - From theory to applications, Academic Press, chapter 2, 47-96, 2013, 978-0-12-401700-9. ⟨10.1016/B978-0-12-401700-9.00002-1⟩. ⟨hal-00926037⟩

• Communication dans un congrès

Broadband microwave interferometry for non destructive evaluation

Kamel Haddadi, Tuami Lasri

A broadband microwave interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, a hybrid coupler, an evanescent microwave coaxial probe and a precise impedance tuner built up with a high precision…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15526, 10 p. ⟨hal-01000209⟩

• Communication dans un congrès

5.4 MHz dog-bone oscillating AFM probe with thermal actuation and piezoresistive detection

Zhuang Xiong, Estelle Mairiaux, Benjamin Walter, Marc Faucher, Lionel Buchaillot, Bernard Legrand

We report on a new concept of Atomic Force Microscope (AFM) oscillating probes using dog-bone resonator with thermal excitation and piezoresistive detection. The resonance frequency is 5.4 MHz and the quality factor is measured about 4,000 in air. AFM images are obtained over PMMA resist sample and…

26th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2013, 2013, Taipei, Taiwan. pp.592-595, ⟨10.1109/MEMSYS.2013.6474311⟩. ⟨hal-00809858⟩