Publications

• Communication dans un congrès

The multi-port technology for microwave sensing applications

Kamel Haddadi, T. Lasri

60th IEEE MTT-S International Microwave Symposium, IMS 2012, 2012, Montréal, Canada. pp.1-3, ⟨10.1109/MWSYM.2012.6258266⟩. ⟨hal-00802597⟩

• Communication dans un congrès

Spectroscopic study of an Ar-H2O discharge excited by a RF helical cavity

Adriana Annusova, Jaroslav Krištof, Pavel Veis, Corinne Foissac, Philippe Supiot

This paper deals with a spectroscopic characterization of an Ar-H2O discharge excited by a helical cavity at 27 MHz. The power and the pressure are fixed to 30 W and 266 Pa, respectively. Emissions from Ar, H, O atoms and the OH(A2Σ+→X2Π) molecular spectral system are studied spatially along the…

21th Annual Conference of Doctoral Students, WDS 2012, May 2012, Prague, Czech Republic. pp.Part II, 99-104. ⟨hal-00802608⟩

• Communication dans un congrès

Fabrication of La2Ti2O7 nanostructures by focused Ga3+ ion beam and characterization by piezoresponse force microscopy

G. Declercq, A. Ferri, Z. Shao, A. Bayart, S. Saitzek, R. Desfeux, D. Deresmes, David Troadec, J. Costecalde, Denis Remiens

Joint 21th International Symposium on Applications of Ferroelectrics, ISAF 2012, 11st European Conference on the Applications of Polar Dielectrics, ECAPD 2012, 4th International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in P, 2012, Aveiro, Portugal. pp.1-3, ⟨10.1109/ISAF.2012.6297772⟩. ⟨hal-00801125⟩

• Article dans une revue

[Review] Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs

F. Berthet, Y. Guhel, H. Gualous, B. Boudart, J.L. Trolet, M. Piccione, V. Sbrugnera, B. Grimbert, Christophe Gaquière

Solid-State Electronics, 2012, 72, pp.15-21. ⟨10.1016/j.sse.2011.12.002⟩. ⟨hal-00788193⟩

• Article dans une revue

In-line dynamic acoustic behavior of a viscoelastic complex media : dough application

Georges Nassar, Bertrand Nongaillard, J. Cheio

Open Acoustics Journal, 2012, 5, pp.39-45. ⟨10.2174/1874837601205010039⟩. ⟨hal-00788343⟩

• Article dans une revue

Large signal microwave performances of high-k metal gate 28 nm CMOS technology

R. Ouhachi, A. Pottrain, D. Ducatteau, Etienne Okada, D. Gloria, Christophe Gaquière

Electronics Letters, 2012, 48, pp.1627-1629. ⟨10.1049/el.2012.3443⟩. ⟨hal-00788176⟩

• Article dans une revue

Evidence of surface states for AlGaN/GaN/SiC HEMTs passivated Si3N4 by CDLTS

M. Gassoumi, B. Grimbert, Christophe Gaquière, H. Maaref

Semiconductors, 2012, 46, pp.382-385. ⟨10.1134/S1063782612030104⟩. ⟨hal-00788194⟩

• Article dans une revue

Analytical modeling of acoustic emission from buried or surface-breaking crack under stress

W. Ben Khalifa, K. Jezzine, G. Hello, Sébastien Grondel

Journal of Physics: Conference Series, 2012, 353, pp.012016-1-12. ⟨10.1088/1742-6596/353/1/012016⟩. ⟨hal-00790432⟩

• Article dans une revue

Low frequency dielectric loss of metal/insulator/organic semiconductor junctions in ambient conditions

Romuald Ledru, Stéphane Pleutin, Bruno Grouiez, Damien Zander, H. Bejbouji, Kamal Lmimouni, Dominique Vuillaume

The complex admittance of metal/oxide/pentacene thin film junctions is investigated under ambient conditions. At low frequencies, a contribution attributed to proton diffusion through the oxide is seen. This diffusion is shown to be anomalous and is believed to be also at the origin of the bias…

Organic Electronics, 2012, 13 (10), pp.1916-1924. ⟨10.1016/j.orgel.2012.04.035⟩. ⟨hal-00787369⟩

• Article dans une revue

Top electrode size effect on hysteresis loops in piezoresponse force microscopy of Pb(Zr,Ti)O3-film on silicon structures

S.L. Bravina, N.V. Morozovsky, E.A. Eliseev, A.N. Morozovska, J. Costecalde, Caroline Soyer, Denis Remiens, D. Deresmes