Publications
Affichage de 841 à 850 sur 16228
Determination of the solid surface energy of tellurium dioxide
G. Guisbiers, E. Badradeen, S. Arscott
Journal of Physics and Chemistry of Solids, 2024, 193, pp.112167. ⟨10.1016/j.jpcs.2024.112167⟩. ⟨hal-04782081v2⟩
Microfabricated vapor cell atomic clocks at FEMTO-ST
Clément Carlé, Martin Callejo, Andrei Mursa, Moustafa Abdel Hafiz, Quentin Tanguy, Rémy Vicarini, Jacques Millo, Vincent Maurice, Emmanuel Klinger, Nicolas Passilly, Rodolphe Boudot
Hot Vapor Workshop, Sep 2024, Stuttgart, Germany. ⟨hal-04770434⟩
Radiated Sound and Transmitted Vibration Following the Ball/Racket Impact of a Tennis Serve
Arthur Paté, Maxime Petel, Nesrine Belhassen, Delphine Chadefaux
Vibration, 2024, 7, pp.894 - 911. ⟨10.3390/vibration7040047⟩. ⟨hal-04865346⟩
SiC for Sensing in Harsh Environment
Marc Portail, Sylvain Kern, Clément Berger, Cécile Ghouila-Houri, Vincent Guigoz, Daniel Alquier, Ileana Florea, Isabelle Dufour, Abdelkrim Talbi, Philippe Pernod, Jean-François Michaud
International Conference on Silicon Carbide and Related Materials, Sep 2024, Rayleigh, North Carolina, United States. ⟨hal-04922976⟩
Silicon tip with low quality and high aspect ratio, probe comprising such silicon tip, microscope comprising such probe, and method for manufacturing such silicon tip
Benjamin Walter, Edouard Lebouvier, Marc Faucher
France, Patent n° : FR3146998 (A1) 2024-09-27. 2024, N° de priorité : FR20230002658 20230322 - N° de demande : WO2023EP68407 20230704. ⟨hal-05652946⟩
Silicon tip with low quality and high aspect ratio, probe comprising such silicon tip, microscope comprising such probe, and method for manufacturing such silicon tip
Benjamin Walter, Edouard Lebouvier, Marc Faucher
France, Patent n° : FR3146998 (A1) 2024-09-27. 2024, N° de priorité : FR20230002658 20230322 - N° de demande : WO2023EP68407 20230704. ⟨hal-05652959⟩
Silicon tip having low mass and high aspect ratio, probe comprising such a silicon tip, microscope comprising such a probe, and method for manufacturing the silicon tip
Benjamin Walter, Edouard Lebouvier, Marc Faucher
France, Patent n° : FR3146998 (A1) 2024-09-27. 2024, N° de priorité : FR20230002658 20230322 - N° de demande : WO2023EP68407 20230704. ⟨hal-05652912⟩
Silicon tip having low mass and high aspect ratio, probe comprising such a silicon tip, microscope comprising such a probe, and method for manufacturing the silicon tip
Benjamin Walter, Edouard Lebouvier, Marc Faucher
Unknown Region, Patent n° : WO2024194446 (A1) 2024-09-26. 2024, N° de priorité : FR20230002658 20230322 - N° de demande : WO2024EP57691 20240321. ⟨hal-05652913⟩