Publications

Affichage de 9541 à 9550 sur 16175


  • Article dans une revue

A theoretical and experimental study of the BCB thin-film cap zero-level package based on FEM simulations

S. Seok, N. Rolland, P.A. Rolland

Journal of Micromechanics and Microengineering, 2010, 20, pp.095010-1-7. ⟨10.1088/0960-1317/20/9/095010⟩. ⟨hal-00548602⟩

  • Communication dans un congrès

Large-area micro organism concentrator by coupled dielectrophoresis and thermohydrodynamics

R. Lejard-Malki, J. Follet, E. Dei-Cas, V. Senez

20th Anniversary World Congress on Biosensors, Biosensors 2010, 2010, Glasgow, Scotland, United Kingdom. ⟨hal-00574484⟩

  • Communication dans un congrès

Towards cell characterization by THz BioMEMS

Simon Laurette, A. Treizebre, Nour Eddine Bourzgui, Bertrand Bocquet

Journées Nationales Communes du GDR Micro et Nano Fluidique et du Club Micro Capteurs Chimiques, 2010, Villeneuve d'Ascq, France. ⟨hal-00574491⟩

  • Communication dans un congrès

Advanced SEM and TEM investigations of individual and self-assembled colloidal PbSe nanocrystals

M. Cheynet, Justin Habinshuti, O. Cristini, E. Rauch, T. Neisius, S. Irsen, B. Grandidier

3rd International Conference on Nanostructures Self-Assembly, NanoSEA 2010, 2010, _, France. ⟨hal-00574127⟩

  • Communication dans un congrès

Dynamique de relaxation dans les jonctions moléculaires organiques

N. Clement, S. Pleutin, David Guérin, D. Vuillaume

12èmes Journées de la Matière Condensée, JMC12, 2010, Troyes, France. ⟨hal-00574086⟩

  • Communication dans un congrès

Actuation and sensing integration challenges at the microscale: the Gordian Knot of the resonant BioMEMS realm

Liviu Nicu, Thomas Alava, Fabrice Mathieu, Cédric Ayela, Caroline Soyer, Denis Remiens

2010 IEEE International Frequency Control Symposium, 2010, San Francisco, United States. ⟨hal-01228741⟩

  • Article dans une revue

Characterization of ytterbium silicide formed in ultra high vacuum

Adam Laszcz, Jacek Ratajczak, Andrzej Czerwinski, Jerzy Katcki, Vesna Srot, Fritz Phillipp, Peter A. van Aken, Dmitri Yarekha, Nicolas Reckinger, Guilhem Larrieu, Emmanuel Dubois

The formation of ytterbium silicide fabricated by annealing at 480 °C for one hour has been studied by means of high resolution transmission electron microscopy (HRTEM) and energy dispersive X-ray spectroscopy (EDS). The annealing process has been performed under ultra high vacuum (UHV) conditions…

Journal of Physics: Conference Series, 2010, 209 : 16th International Conference on Microscopy of Semiconducting Materials, pp.012056 (1--4). ⟨10.1088/1742-6596/209/1/012056⟩. ⟨hal-00549559⟩

  • Article dans une revue

Polarization-independent imaging with an acousto-optic tandem system

Konstantin B. Yushkov, Samuel Dupont, Jean-Claude Kastelik, V.B. Voloshinov

Optics Letters, 2010, 35, pp.1416-1418. ⟨10.1364/OL.35.001416⟩. ⟨hal-00549023⟩

  • Article dans une revue

Modeling and Simulation of the Failure and Stiffness Degradation of a Graphite Epoxy in a Three Point Bending Test

E. Irhirane, M. Abousaleh, J. Echaabi, M. Hattabi, A. Saouab, M. Bensalah

Journal of Engineering Materials and Technology, 2010, 132 (3), pp.031013. ⟨hal-01942752⟩