Publications

• Article dans une revue

Ultrasonic and acoustic investigation of cheese matrix at the beginning and the end of ripening period

Georges Nassar, Fabrice Lefebvre, A. Skaf, Julien Carlier, Bertrand Nongaillard, Y. Noel

In this paper, a low frequency, dry contact, ultrasonic technique devoted to the study and characterization of cheeses at the beginning and the end of ripening period is investigated. For compact or weakly opened matrix found in the early step of cheese making, ultrasonic velocity is indicated to…

Journal of Food Engineering, 2010, 96, pp.1-13. ⟨10.1016/j.jfoodeng.2009.06.029⟩. ⟨hal-00549529⟩

• Article dans une revue

Kinetics of RPECVD organosilicon polymer post-treatment in a N2/O2 microwave plasma remote afterglow

S. Abou Rich, V. Mille, Céline Vivien, S. Godey, P. Supiot

Plasma Processes and Polymers, 2010, 7, pp.775-784. ⟨10.1002/ppap.200900185⟩. ⟨hal-00549497⟩

• Article dans une revue

Wavelength and beam launching effects on silica optical fiber in local area networks

H. Mrabet, Iyad Dayoub, R. Attia, W. Hamouda

Optics Communications, 2010, 283, pp.4234-4241. ⟨10.1016/j.optcom.2010.06.034⟩. ⟨hal-00549472⟩

• Article dans une revue

Explosive instability of quasi-phonon triads in antiferromagnet under frequency modulated electromagnetic field

Vladimir Preobrazhensky, O. Yevstafyev, Philippe Pernod, V. Berzhansky

Journal of Magnetism and Magnetic Materials, 2010, 322, pp.585-588. ⟨10.1016/j.jmmm.2009.09.067⟩. ⟨hal-00548960⟩

• Article dans une revue

Development of Time-resolved UV Micro-Raman Spectroscopy to measure temperature in AlGaN/GaN HEMTs

Ophélie Lancry, Emmanuelle Pichonat, Julien Réhault, Myriam Moreau, Raphaël Aubry, Christophe Gaquière

We report on the development of Time-resolved Ultraviolet Micro-Raman Scattering to measure transient self-heating effects in semiconductor devices. Temperature measurements are performed on AlGaN/GaN High-electron-mobility transistors (HEMTs) grown on SiC substrate. Ultraviolet excitation probes…

Solid-State Electronics, 2010, 54, pp.1434 - 1437. ⟨10.1016/j.sse.2010.05.029⟩. ⟨hal-00514166⟩

• Communication dans un congrès

Ultrasonic characterization of fluid saturated absorbing polymethylacrylate porous plates

S. Derible, Pierre Campistron, G. Freiha, H. Franklin, Bertrand Nongaillard

Joint 159th ASA Meeting and Noise-Con 2010, 2010, Baltimore, MD, United States. ⟨hal-00591739⟩

• Communication dans un congrès

Size-dependent properties of platinum-based bimetallic nanoparticles

G. Guisbiers, G. Abudukelimu, D. Hourlier

5th International Conference on Surfaces, Coatings and Nano-Structured Materials, NANOSMAT-5, 2010, Reims, France. ⟨hal-00591744⟩

• Article dans une revue

Rumpling of LiF(001) surface from fast atom diffraction

A. Schuller, S. Wethekam, D. Blauth, H. Winter, F. Aigner, N. Simonovic, B. Solleder, J. Burgdorfer, L. Wirtz

Physical Review A : Atomic, molecular, and optical physics [1990-2015], 2010, 82, pp.062902-1-10. ⟨10.1103/PhysRevA.82.062902⟩. ⟨hal-00551942⟩

• Communication dans un congrès

Déformation et déplacement de gouttes par ondes de surfaces acoustiques

Philippe Brunet, Michael Baudoin, Olivier Bou Matar, Farzam Zoueshtiagh

Les ondes de surfaces acoustiques peuvent être utilisées pour déformer et déplacer des gouttes partiellement mouillantes sur une surface solide. Afin de déterminer la physique sous-jacente, le déplacement d'une goutte excitée par une onde de surface a été observé à l'aide d'une…

10ème Congrès Français d'Acoustique, Apr 2010, Lyon, France. pp.1-6. ⟨hal-00550911⟩

• Chapitre d'ouvrage

Electrostatic force microscopy and Kelvin force microscopy as a probe of the electrostatic and electronic properties of carbon nanotubes

Thierry Melin, Mariusz Zdrojek, David Brunel

This chapter addresses recent experimental studies on carbon nanotubes and nanotube devices using electrical techniques derived from atomic force microscopy. Electrostatic force microscopy (EFM), Kelvin force microscope (KFM), and their variants are introduced. We show how EFM-related techniques…

B. Bhushan. Scanning probe microscopy in nanoscience and nanotechnology, Springer, chapitre 4, 89-128, 2010, ⟨10.1007/978-3-642-03535-7_4⟩. ⟨hal-00575864⟩