Publicaciones

• Communication dans un congrès

Thickness dependent morphology and resistivity of ultra-thin Al films on Si(111) by molecular beam expitaxy

D.K. Aswal, N. Joshi, A.K. Debnath, S.K. Gupta, D. Vuillaume, J.V. Yakhmi

Trends in NanoTechnology, TNT 2005, 2005, Oviedo, Spain. ⟨hal-00125603⟩

• Communication dans un congrès

Optical gating of polymer-coated carbon nanotube transistors

J. Borghetti, S. Lenfant, Vincent Derycke, P. Chenevier, A. Filoramo, M. Goffman, D. Vuillaume, J.P. Bourgoin

ElecMol'05, 2005, Grenoble, France. ⟨hal-00125606⟩

• Article dans une revue

Experimental evidence of backward wave on terahertz left-handed transmision lines

T. Crepin, Jean-Francois Lampin, T. Decoopman, X. Melique, L. Desplanque, D. Lippens

Applied Physics Letters, 2005, 87, pp.104105-1-3. ⟨hal-00125345⟩

• Article dans une revue

Modeling and experimental validation of sharpening mechanism based on thermal oxidation for fabrication of ultra-sharp silicon nanotips

Vincent Agache, Roger Ringot, Patrice Bigotte, Vincent Senez, Bernard Legrand, Lionel Buchaillot, Dominique Collard

This paper aims at modeling the thermal oxidation of silicon pillars leading to the formation of very sharp silicon tips. The model is used to determine optimum process parameters with respect to the initial shape of the silicon pillars and the geometry of the desired tip. The modeling concept is...

IEEE Transactions on Nanotechnology, 2005, 4, pp.548-556. ⟨10.1109/TNANO.2005.851386⟩. ⟨hal-00125632⟩

• Communication dans un congrès

Characterization of vertical vibration of electrostatically actuated resonators using Atomic Force Microscope in noncontact mode

Vincent Agache, Bernard Legrand, K. Nakamura, H. Kawakatsu, Lionel Buchaillot, Hiroshi Toshiyoshi, Dominique Collard, Hiroyuki Fujita

Non contact mode atomic force microscope (AFM) direct characterization of out-of-plane fixed-fixed high frequency microelectromechanical resonators is examined while applying the excitation voltage to integrated electrostatic transducers. Non contact mode is rather used than contact mode in order...

The 13th International Conference on Solid-State Sensors, Actuators and Microsystems, 2005, Jun 2005, Seoul, South Korea. pp.2023-2026, ⟨10.1109/SENSOR.2005.1497499⟩. ⟨hal-00125631⟩

• Article dans une revue

Morphology-dependent electrical transport in textured ultra-thin Al films on Si

D.K. Aswal, N. Joshi, A.K. Debnath, K.P. Muthe, S.K. Gupta, J.V. Yakhmi, D. Vuillaume

Journal of Applied Physics, 2005, 98, pp.026103. ⟨hal-00125583⟩

• Article dans une revue

Three-dimensionnal calculation of propagation losses in photonic crystal waveguides

S. Fasquel, Xavier Mélique, Olivier Vanbésien, D. Lippens

Optics Communications, 2005, 246 (1-3), pp.91-96. ⟨hal-00401300⟩

• Chapitre d'ouvrage

Transport électronique dans une molécule : une nouvelle diode

D. Vuillaume, C. Delerue

Images de la physique 2005, Spécial Année mondiale de la physique, Editions du CNRS, Paris, France, pp.186-191, 2005. ⟨hal-00131700⟩

• Chapitre d'ouvrage

A blind deconvolution for free space profile retrieval at microwave frequencies

D. Glay, T. Lasri

KUPFER K. Electromagnetic aquametry - Electromagnetic wave interaction with water and moist substances, Springer Verlag Heidelberg, pp.257-275, 2005. ⟨hal-00132301⟩

• Communication dans un congrès

Thermal behaviour modelling of high power active devices using the ATILA finite element code

J.C. Debus, P. Mosbah, J.B. Blottman

Proceedings of the 2005 International Workshop on Smart Materials and Structures, CanSmart 2005, 2005, Toronto, Ontario, Canada. ⟨hal-00131118⟩