Publicaciones

Affichage de 13611 à 13620 sur 16059


  • COMM

Physical analysis of the breakdown phenomenon between single or double step gate recess HEMTs

M. Elkhou, Michel Rousseau, H. Gerard, Jean-Claude de Jaeger

2004, pp.571-574. ⟨hal-00142307⟩

  • COMM

Analysis of hot carrier aging degradation in GaN MESFETs

R. Pierobon, F. Rampazzo, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni

2004, pp.143-146. ⟨hal-00141969⟩

  • ART

AlGaN/GaN HEMTs : technology and microwave performance

Jean-Claude de Jaeger

Microwave Engineering Europe, 2004, mai, pp.30. ⟨hal-00141996⟩

  • COMM

Mesures pulsées haute température en mode DC et RF de HEMTs AlGaN/GaN sur substrat silicium haute résistivité

M. Werquin, D. Ducatteau, N. Vellas, D. Jambon, D. Theron, E. Delos, N. Caillas, Y. Cordier, Jean-Claude de Jaeger, S. Delage, Christophe Gaquière

GDR Grand Gap, 2004, Fréjus, France. ⟨hal-00141965⟩

  • COMM

Data transmission and distance measurement between two trains in tunnels

M. Lienard, Pierre Laly, Pierre Degauque

2004, pp.CD session B2. ⟨hal-00142001⟩

  • COMM

Propagation characteristics in subway tunnels : application to a communication and distance measurement system

M. Lienard, Pierre Degauque, Pierre Laly

2004, pp.240-243. ⟨hal-00142024⟩

  • COMM

Plateforme SAW dédiée à la microfluidique discrète pour applications biologiques

A. Renaudin, P. Tabourier, V. Zhang, C. Druon

Actes du 2ème Congrès Français de Microfluidique, 2004, Toulouse, France. ⟨hal-00142067⟩

  • ART

High microwave and noise performance of 0.17µm AlGaN/GaN HEMTs on high-resistivity silicon substrates

A. Minko, Virginie Hoel, Sylvie Lepilliet, Gilles Dambrine, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies

IEEE Electron Device Letters, 2004, 25, pp.167-169. ⟨hal-00141951⟩