Publicaciones

Affichage de 13751 à 13760 sur 16056


  • ART

Optimization of HSQ resist e-beam processing technique on GaAs material

D. Lauvernier, Jean-Pierre Vilcot, M. Francois, Didier Decoster

Microelectronic Engineering, 2004, 75, pp.177-182. ⟨hal-00141186⟩

  • ART

Probing nanoscale dipole-dipole interactions by electric force microscopy

Thierry Melin, H. Diesinger, D. Deresmes, D. Stievenard

Physical Review Letters, 2004, 92, pp.166101-1-4. ⟨hal-00141249⟩

  • COMM

Démultiplexeur nanométriques à plasmons

Maxime Beaugeois, L. Dobrzynski, Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Mohamed Bouazaoui, Jean-Pierre Vilcot, J.P. Vigneron

GDR Ondes, 2004, Orsay, France. ⟨hal-00141207⟩

  • COMM

Conductivity change in a metal/pentacen/metal device

D. Tondelier, K. Lmimouni, David Troadec, C. Dufour, D. Vuillaume, C. Fery, J.P. Dagois, G. Haas

European Materials Research Society Spring Meeting, 2004, Strasbourg, France. ⟨hal-00140739⟩

  • COMM

Diodes moléculaires auto-assemblées sur silicium

S. Lenfant, C. Merckling, David Guérin, D. Vuillaume, F. Tran Van, C. Chevrot

Journées Nationales du GDR Nanoélectronique, 2004, Aussois, France. ⟨hal-00140745⟩

  • COMM

Microfluidic devices to measure the electrical impedance of single bio-cells

V. Senez, T. Yamamoto, B. Poussard, T. Fukuba, J.M. Capron, T. Fujii

2004, pp.53-56. ⟨hal-00141029⟩

  • COMM

Numerical analysis of the process induced stresses in micromachined cantilever

V. Senez, T. Hoffmann

2004, pp.126-131. ⟨hal-00141034⟩

  • ART

LP-MOCVD growth of GaAlN/GaN heterostructures on silicon carbide. Application to HEMT's devices

Marie-Antoinette Di Forte-Poisson, M. Magis, Maurice Tordjman, Raphaël Aubry, Nicolas Sarazin, M. Peschang, Erwan Morvan, Sylvain Laurent Delage, J. Di Persio, R. Quere, B. Grimbert, Virginie Hoel, E. Delos, Damien Ducatteau, Christophe Gaquière

This paper reports on the LP-MOCVDgrowth optimisation of GaAlN/GaN heterostructures grown on silicon carbide substrates for HEMT applications, and on the first device performances obtained with these structures. The critical impact of some growth parameters on the physical properties of the GaAlN/...

Journal of Crystal Growth, 2004, 272 (1-4), pp.305-311. ⟨10.1016/j.jcrysgro.2004.08.121⟩. ⟨hal-00141957⟩