Publicaciones
Affichage de 13751 à 13760 sur 16170
Interpretation and reconstruction of Sadi Carnot’s Réflexions through original sentences belonging to non–classical logic
Antonino Drago, Raffaele Pisano
Atti della Fondazione Ronchi, 2004, LIX (5), pp.615-644. ⟨hal-04508054⟩
Application de la sismique réflexion pour la reconnaissance du sous-sol aux faibles profondeurs
Bogdan Piwakowski, T. Windal, C. Gomez
Actes des Journées Nationales de Géotechnique et de Géologie de l'Ingénieur, JNGGI 2004, 2004, Lille, France. ⟨hal-00247817⟩
Submicrometer InAlAs/InGaAs double-gate HEMT's on transferred substrate
Nicolas Wichmann, I. Duszynski, T. Parenty, S. Bollaert, J. Mateos, X. Wallart, A. Cappy
2004, pp.215-218. ⟨hal-00133903⟩
Terahertz emission by plasma waves in 60 nm gate high electron mobility transistors
W. Knap, J. Lusabowski, T. Parenty, S. Bollaert, A. Cappy, V.V. Popov, M.S. Shur
Applied Physics Letters, 2004, 84, pp.2331-2333. ⟨hal-00133879⟩
Radiation of directional seismic sources within a half space
Madjid Berraki, Bertrand Dubus, Axelle Baroni
Anglo-French Physical Acoustics Conference, Jan 2004, Wye, United Kingdom. ⟨hal-00133872⟩
Design of narrow-band DBR planar filter in Si-BCB technology for millimetter-waves applications
G. Prigent, E. Rius, François Le Pennec, S. Le Maguer, Cédric Quendo, G. Six, H. Happy
IEEE Transactions on Microwave Theory and Techniques, 2004, 52, pp.1045-1051. ⟨hal-00133867⟩
Design space exploration for analog IPs using Cairo+
R. Iskander, L. de Lamarre, A. Kaiser, M.M. Louerat
2004, pp.473 - 476. ⟨hal-00140990⟩
Reliability investigation of gallium nitride HEMT microelectronics reliability
A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, S.L. Delage, N. Chaturvedi, R. Lossy, J. Wuerfl
Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩
Experimental analysis of a multi-conductor uniform line above soil for modelling a railway line
A. Cozza, F. Canavero, B. Demoulin, J.M. Bodson, V. Sabate, J.M. Vanzemberg
2004, pp.465-468. ⟨hal-00142009⟩
Study by ultrasound of the impact of technological parameters changes in the milk gelation process
Georges Nassar, Bertrand Nongaillard, Y. Noel
Journal of Food Engineering, 2004, 63, pp.229-236. ⟨hal-00142002⟩