Publicaciones
Affichage de 13761 à 13770 sur 16104
Physical analysis of the breakdown phenomenon between single or double step gate recess HEMTs
M. Elkhou, Michel Rousseau, H. Gerard, Jean-Claude de Jaeger
2004, pp.571-574. ⟨hal-00142307⟩
Performance improvement of DS-CDMA on the LOS multipath 60 GHz channel using block turbo coding
A. Goalic, W. Sawaya, R. Okouyi, Laurent Clavier
2004, pp.133-136. ⟨hal-00142300⟩
THz study of liquids using an integrated bragg filter
Jean-Francois Lampin, L. Desplanque, M. Ternisien, T. Crepin, C. Walloth, D. Lippens, F. Mollot
2004, pp.469-470. ⟨hal-00140721⟩
Confinement effects in PbSe quantum wells and nanocrystals
Guy Allan, Christophe Delerue
Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2004, 70, pp.245321/1-9. ⟨10.1103/PhysRevB.70.245321⟩. ⟨hal-00141253⟩
Self-assembled molecular diodes on silicon
S. Lenfant, C. Merckling, David Guérin, D. Vuillaume, F. Tran Van, C. Chevrot
Ultimate Lithography and Nanodevice Engineering, 2004, Agelonde, France. ⟨hal-00140751⟩
Effects of grain boundaries, field dependent mobility and interface state traps on the characteristics of pentacene thin film transistor
A. Bolognesi, M. Berliocchi, M. Manenti, Aldo Di Carlo, Paolo Lugli, Kamal Lmimouni, Claude Dufour
IEEE Transactions on Electron Devices, 2004, 51 (12), pp.1997-2003. ⟨10.1109/TED.2004.838333⟩. ⟨hal-00140735⟩
Mesures pulsées haute température en mode DC et RF de HEMTs AlGaN/GaN sur substrat silicium haute résistivité
M. Werquin, D. Ducatteau, N. Vellas, D. Jambon, D. Theron, E. Delos, N. Caillas, Y. Cordier, Jean-Claude de Jaeger, S. Delage, Christophe Gaquière
GDR Grand Gap, 2004, Fréjus, France. ⟨hal-00141965⟩
Transistor MOSFET Schottky en régime nanométrique
G. Larrieu, Emmanuel Dubois
Journées Nationales Nanoélectronique, 2004, Aussois, France. ⟨hal-00140994⟩
Broadband frequency filtering and mode matching using finline technology
T. Decoopman, X. Melique, O. Vanbésien, D. Lippens
Microwave and Optical Technology Letters, 2004, 41, pp.234-7. ⟨hal-00133953⟩
Measurement of low Schottky barrier heights applied to metallic source/drain metal–oxide–semiconductor field effect transistors (MOSFETs)
Emmanuel Dubois, G. Larrieu
Journal of Applied Physics, 2004, 96, pp.729-737. ⟨hal-00140973⟩