Publicaciones
Affichage de 13971 à 13980 sur 16261
1/f noise and ballistic mobility in GaN/AlGaN heterostructure field effect transistors in high magnetic fields
S.L. Rumyantsev, M. Shur, W. Knap, N. Dyakonova, F. Pascal, A. Hoffman, Y. Guhel, Christophe Gaquière, D. Theron
2004, pp.277-85. ⟨hal-00141970⟩
Matching ultrasonic transducer using two matching layers where one of them is glue
Dorothée Debavelaere-Callens, C. Bruneel, Jamal Assaad
NDT & E International, 2004, 37, pp.591-596. ⟨hal-00141975⟩
LP-MOCVD growth of GaAlN/GaN heterostructures on silicon carbide. Application to HEMT's devices
Marie-Antoinette Di Forte-Poisson, M. Magis, Maurice Tordjman, Raphaël Aubry, Nicolas Sarazin, M. Peschang, Erwan Morvan, Sylvain Laurent Delage, J. Di Persio, R. Quere, B. Grimbert, Virginie Hoel, E. Delos, Damien Ducatteau, Christophe Gaquière
Journal of Crystal Growth, 2004, 272 (1-4), pp.305-311. ⟨10.1016/j.jcrysgro.2004.08.121⟩. ⟨hal-00141957⟩
Méthodes d'évaluations expérimentales des couplages électromagnétiques
L. Kone, B. Demoulin, S. Baranowski
Journée 'caractérisation et diagnostic en champ proche des dispositifs intégrés, modélisation et mesures rapides', 2004, Paris, France. ⟨hal-00142023⟩
Design of a wide-angle spectrum source for material characterization : point low-frequency ultrasonic sensor
Georges Nassar, Bertrand Nongaillard
NDT & E International, 2004, 37, pp.481-488. ⟨hal-00141974⟩
Principles of MMMS actuation by locally deposed magnetostrictive thin films with induced spin reorientation transition
Vladimir Preobrazhensky, Philippe Pernod, H. Le Gall, S. Masson, O. Ducloux, S. Euphrasie
2004, pp.374-377. ⟨hal-00140731⟩
Microfluidic devices to measure the electrical impedance of single bio-cells
V. Senez, T. Yamamoto, B. Poussard, T. Fukuba, J.M. Capron, T. Fujii
2004, pp.53-56. ⟨hal-00141029⟩
An original methodology to assess fatigue behavior in RF MEMS devices
O. Millet, Pierre Bertrand, Bernard Legrand, D. Collard, L. Buchaillot
European Microwave Week, 2004, Amsterdam, Netherlands. ⟨hal-00141031⟩
Numerical analysis of the process induced stresses in micromachined cantilever
V. Senez, T. Hoffmann
2004, pp.126-131. ⟨hal-00141034⟩