Publicaciones

Affichage de 4231 à 4240 sur 16462


  • Communication dans un congrès

[BEST PAPER AWARD] Fall Detection of a Person in a Reverberant Environment using Bistatic Radar

M. Yusuf, B. De Beelde, E. Tanghe, Pierre Laly, D.P. Gaillot, M. Lienard, E. De Poorter, L. Martens, W. Joseph

  • Poster de conférence

Evaluation of the optoelectronic properties of ZnSnN2 thin films under different growth conditions and doping implantation of As and P at different concentrations

Leonardo Kopprio, Sylvain Le Gall, Christophe Longeaud, Ngoc Kim Thanh Bui, Boubakeur Ayachi, Jean-Pierre Vilcot, Agathe Virfeu, Jean-François Pierson

JNPV 2019, Dec 2019, Dourdan, France. ⟨hal-02419004⟩

  • Communication dans un congrès

Optomechanics: a key towards next-generation experiments in atomic force microscopy?

Lucien Schwab, Pierre Allain, Didier Theron, Marc Faucher, Benjamin Walter, Sébastien Hentz, Guillaume Jourdan, Ivan Favero, Bernard Legrand

Atomic Force Microscopy (AFM) is a versatile and ubiquitous technique based on a resonating tip probe that interacts with the sample to be analysed in terms of topography and mechanical properties. Next-generation investigations in molecular biophysics like protein folding/unfolding, receptor-...

International Conference on Quantum Metrology and Sensing, Dec 2019, Paris, France. ⟨hal-02407634⟩

  • Article dans une revue

Channel correlation-based approach for feedback overhead reduction in massive MIMO

Frédéric Challita, Pierre Laly, Marwan Yusuf, Emmeric Tanghe, Wout Joseph, Pierre Degauque, M. Lienard, Davy Gaillot

For frequency-division duplex multiple-input-multiple-output (MIMO) systems, the channel state information at the transmitter is usually obtained by sending pilots or reference signals from all elements of the antenna array. The channel is then estimated by the receiver and communicated back to the...

IEEE Antennas and Wireless Propagation Letters, 2019, 18 (12), pp.2478-2482. ⟨10.1109/LAWP.2019.2940829⟩. ⟨hal-03133317⟩

  • Communication dans un congrès

Study of Various PhotoResist for Bosch Process

Arnaud Pageau, Garrett Curley, Pascal Tilmant, Francois Vaurette, Dmitri Yarekha

Euronanolab Dry Etch Expert meeting, Dec 2019, Saclay, France. ⟨hal-03635045⟩