Publicaciones

Affichage de 9431 à 9440 sur 16055


  • COMM

Vertical coaxial transitions for MM-waves 3D integration technologies

R. Crunelle, S. Seok, J. Kim, M. Fryziel, N. Rolland, A. Cathelin, P. Rolland

40th European Microwave Conference, EuMC 2010, 2010, France. pp.101-104. ⟨hal-00549940⟩

  • COMM

Comparison of low phase noise oscillators topologies using BAW resonator

M. Li, S. Seok, N. Rolland, P.A. Rolland, H. El Aabbaoui, E. de Foucauld, P. Vincent

5th European Microwave Integrated Circuits Conference, EuMIC 2010, 2010, France. pp.345-348. ⟨hal-00549942⟩

  • COUV

Combined source and channel strategies for optimized video communications

François-Xavier Coudoux, Patrick Corlay, Marie Zwingelstein, Mohamed Gharbi, C. Mouton-Goudemand, Marc G. Gazalet

F. De Rango. Digital video, INTECH, chapitre 19, 28 p., 2010. ⟨hal-00576274⟩

  • COMM

Time-resolved electron density and OES measurements for studying the surface loss rates of H and Cl atoms in a Cl2-H2 ICP plasma

G. Curley, L. Gatilova, S. Guilet, S. Bouchoule, G. Gogna, N. Sirse, S. Karkari, J.P. Booth

63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas, 2010, Paris, France. TF4-005, 763-764, Hori M. and Graha W.G. (Eds), Japan Society of Applied Physics. ⟨hal-00800895⟩

  • COMM

Left-handed elastic shear and longitudinal elastic waves in 2D phononic crystals made of a solid matrix

Charles Croënne, Anne-Christine Hladky, Jerome O. Vasseur, M. Bavencoffe, A. Tinel, B. Morvan, Bertrand Dubus

20th International Congress on Acoustics, ICA 2010, 2010, Sydney, Australia. pp.633-637. ⟨hal-00800840⟩

  • COMM

High temperature stability of nitride-based power HEMT

D. Maier, M. Alomari, N. Grandjean, J.F. Carlin, M.A. Di Forte-Poisson, C. Dua, A. Chuvilin, David Troadec, Christophe Gaquière, U. Kaiser, S.L. Delage, E. Kohn

18th International Conference on Microwave, Radar and Wireless Communications, MIKON-2010, 2010, Vilnius, Lithuania. pp.1-4. ⟨hal-00800892⟩

  • ART

Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications

J. Ratajczak, A. Laszcz, A. Czerwinski, J. Katcki, F. Phillipp, P.A. van Aken, N. Reckinger, Emmanuel Dubois

In this paper, we present results of transmission electron microscopy studies on erbium silicide structures fabricated under various thermal conditions. A titanium cap has been used as a protective layer against oxidation during rapid thermal annealing of an erbium layer in a temperature range of...

Journal of Microscopy, 2010, EM 2008 ‐ XIII International Conference on Electron Microscopy, 237 (3), pp.379-383. ⟨10.1111/j.1365-2818.2009.03264.x⟩. ⟨hal-00549623⟩