Publications
Affichage de 13681 à 13690 sur 16104
Measure of the temperature-depth profile by an S band radiometric receiver for biomedical applications
S. Bri, L. Zenkouar, A. Saadi, L. Bellarbi, M. Habibi, A. Mamouni
Annals of Telecommunications - annales des télécommunications, 2004, 59, pp.467-484. ⟨hal-00133928⟩
Growth of Be-doped GaInP/GaAs heterostructure bipolar transistor by all solid-source multiwafer production molecular beam epitaxy
A. Wilk, M. Zaknoune, S. Godey, S. Dhellemmes, P. Gérard, C. Chaix, F. Mollot
Journal of Vacuum Science and Technology, 2004, 22 (3), pp.1444-1449. ⟨10.1116/1.1738665⟩. ⟨hal-00162756⟩
Micro-transformateur piézoélectrique intégré sur substrat en silicium
Dejan Vasic, François Costa, Emmanuel Sarraute, Patrick Sangouard, Eric Cattan
Revue Internationale de Génie Electrique, 2004, 7 (3-4), pp.315-332. ⟨hal-00811665⟩
Visualization of phase conjugate ultrasound waves passed through inhomogeneous layer
K. Yamamoto, Philippe Pernod, Vladimir Preobrazhensky
Ultrasonics, 2004, 42, pp.1049-1052. ⟨hal-00140728⟩
Data transmission and distance measurement between two trains in tunnels
M. Lienard, Pierre Laly, Pierre Degauque
2004, pp.CD session B2. ⟨hal-00142001⟩
Analysis of hot carrier aging degradation in GaN MESFETs
R. Pierobon, F. Rampazzo, D. Pacetta, Christophe Gaquière, D. Theron, B. Boudart, G. Meneghesso, E. Zanoni
2004, pp.143-146. ⟨hal-00141969⟩
AlGaN/GaN HEMTs : technology and microwave performance
Jean-Claude de Jaeger
Microwave Engineering Europe, 2004, mai, pp.30. ⟨hal-00141996⟩
High microwave and noise performance of 0.17µm AlGaN/GaN HEMTs on high-resistivity silicon substrates
A. Minko, Virginie Hoel, Sylvie Lepilliet, Gilles Dambrine, Jean-Claude de Jaeger, Y. Cordier, F. Semond, F. Natali, J. Massies
IEEE Electron Device Letters, 2004, 25, pp.167-169. ⟨hal-00141951⟩
Detection of gold colloid adsorption at a solid/liquid interface using micromachined piezoelectric resonators
M. Guirardel, Liviu Nicu, Daisuke Saya, Y. Tauran, Eric Cattan, Denis Remiens, C. Bergaud
Japanese Journal of Applied Physics, part 2 : Letters, 2004, 43, pp.L111-L114. ⟨hal-00141179⟩