Publications
Affichage de 14471 à 14480 sur 16263
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures
J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Julien Penaud, Xavier Baie
Conference on Microscopy of Semiconducting Materials, Mar 2003, Cambridge, United Kingdom. pp.479-482, ⟨10.1201/9781351074636-110⟩. ⟨hal-00250182⟩
Nonlinear acoustics of phase conjugate waves in heterogeneous media (NGA approach)
Vladimir Preobrazhensky, Philippe Pernod
2003, pp.875-878. ⟨hal-00146134⟩
Visualization of phase conjugate ultrasound waves passed through inhomogeneous layer
K. Yamamoto, Philippe Pernod, Vladimir Preobrazhensky
Ultrasonics International, 2003, Granada, Spain. ⟨hal-00146159⟩
On lateral organization of quantum dots on a nanopatterned substrate
C. Priester
Materials Research Society Fall Meeting, Symposium T : Self-Organized Processes in Semiconductor Heteroepitaxy, 2003, Boston, MA, United States. ⟨hal-00146119⟩
Inelastic electron tunneling spectroscopy in n-MOS junctions with ultra-thin oxides
C. Petit, G. Salace, D. Vuillaume
Solid-State Electronics, 2003, 47, pp.1663-1668. ⟨hal-00146155⟩
Self-assembled materials
D. Vuillaume
International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩
Nondestructive defects detection inside dielectric materials by microwave techniques
M. Maazi, D. Glay, T. Lasri
2003, pp.Session 3A. ⟨hal-00146044⟩
Time frequency and Kalman filter based baud rate estimator
David Boulinguez, Christelle Garnier, Yves Delignon, Laurent Clavier
3rd International Symposium on Image and Signal Processing and Analysis, ISPA 2003, Sep 2003, Rome, Italy. pp.866-870, ⟨10.1109/ISPA.2003.1296400⟩. ⟨hal-00146072⟩
High frequency noise sources extraction in nanometrique MOSFETs
Francois Danneville, G. Pailloncy, Gilles Dambrine
NATO Advanced Research Workshop, Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices, 2003, Brno, Czech Republic. ⟨hal-00146038⟩