Publications
Affichage de 15511 à 15520 sur 16232
70 GHz Fmax fully-depleted SOI MOSFET's for low power wireless applications
C. Raynaud, O. Faynot, J.L. Pelloie, C. Tabone, A. Grouillet, F. Martin, Gilles Dambrine, M. Vanmackelberg, L. Picheta, E. Mackowiak, H. Brut, P. Llnares, J. Sevenhans, E. Compagne, G. Fletcher
2000, 4 pp. ⟨hal-00157876⟩
Improved Monte Carlo algorithm for the simulation of delta-doped AlInAs/GaInAs HEMTs
J. Mateos-Lopez, T. Gonzalez, D. Pardo, Virginie Hoel, H. Happy, A. Cappy
IEEE Transactions on Electron Devices, 2000, 47, pp.250-253. ⟨hal-00157880⟩
Comparison of microwave performances for fully and partially depleted sub-quarter micron SOI MOSFETs
M. Goffioul, Gilles Dambrine, D. Vanhoenacker, J.P. Raskin
Proceedings of the 5th Symposium on Diagnostics and Yield : SOI-Materials, Devices and Characterization, D&Y'2000, 2000, Warsaw, Poland. ⟨hal-00157893⟩
Stage de sensibilisation des étudiants au travail en salle blanche : réalisation d'éléments actifs et passifs
Virginie Hoel, H. Happy, P. Delemotte, Gilles Dambrine, A. Cappy
VIèmes Journées Pédagogiques du CNFM, 2000, Saint-Malo, France. ⟨hal-00157900⟩
Numerical modelling of shape memory alloy nonlinear behavior laws : application to an adaptative structure
Anne-Christine Hladky, S. Rafanomezantsoa, L. Buchaillot
ONR Workshop on Acoustic Transduction Materials and Devices, 2000, University Park, United States. ⟨hal-00157842⟩
Issues in high frequency noise simulation for deep submicron MOSFET's
J.S. Goo, C.H. Choi, Francois Danneville, Z. Yu, T. Lee, R. Dutton
2000, pp.401-406. ⟨hal-00157897⟩
High frequency noise parameters of 0.25 µm SOI MOSFETs : comparison between fully and partially-depleted devices
M. Vanmackelberg, L. Picheta, C. Raynaud, J.L. Pelloie, F. Martin, D. Vanhoenacker, Gilles Dambrine
2000, pp.51-54. ⟨hal-00157905⟩
Analysis of 900 MHz saw filters on ZNO/GaAs structures
A. Haddou, Tadeusz Gryba, Jean-Etienne Lefebvre, Véronique Sadaune, V. Zhang, Eric Cattan
2000, pp.91-94. ⟨hal-00157862⟩
Theoretical and experimental study of multilayer structures using neural net classification methods
K. Harrouche, Jean-Michel Rouvaen, Mohammadi Ouaftouh, Mohamed Ourak, F. Haine
Measurement Science and Technology, 2000, 11, pp.285-290. ⟨hal-00159046⟩