Publications
Affichage de 15561 à 15570 sur 16064
Quantum confinement energies in zinc-blende III-V and diamond IV semiconductors
Guy Allan, Yann-Michel Niquet, Christophe Delerue
Applied Physics Letters, 2000, 77, pp.639-641. ⟨10.1063/1.127070⟩. ⟨hal-00158665⟩
Modeling of integrated Lamb waves generation systems using a coupled finite element-normal modes expansion method
Emmanuel Moulin, Jamal Assaad, Christophe Delebarre, Sébastien Grondel, D. Balageas
Ultrasonics, 2000, 38, pp.522-526. ⟨hal-00159052⟩
New 434 MHz interstitial hyperthermia system monitored by radiometry : theoretical studies and experimental results
J.C. Camart, D. Despretz, B. Prevost, J.P. Sozanski, M. Chive, J. Pribetich
International Journal of Hyperthermia, 2000, 16, pp.95-111. ⟨hal-00158149⟩
Détection par micro-ondes de défauts dans les matériaux diélectriques
D. Glay, T. Lasri, A. Mamouni, Y. Leroy
6èmes Journées Caractérisation Microondes et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158162⟩
Etude expérimentale de l'inversion thermique en radiométrie micro-onde par corrélation : applications médicales
S. Bri, L. Bellarbi, M. Elkadiri, L. Zenkour, M. Habibi, A. Mamouni
6èmes Journées Caractérisation Microonde et Matériaux, JCMM 2000, 2000, Paris, France. ⟨hal-00158164⟩
New regulated voltage down converter based on modified bandgap cell
Edith Kussener, Herve Barthelemy, A. Robers, A. Malherbe, A. Kaiser
2000, pp.19-21. ⟨hal-00158509⟩
High Q InP-based varactor diodes
T. David, P. Mounaix, X. Melique, F. Mollot, O. Vanbésien, M. Chaubet, D. Lippens
Proceedings of the 11th International Symposium on Space Terahertz Technology, 2000, Ann Arbor, MI, United States. ⟨hal-00158223⟩
Dry etching for gate recessing on AlGaN/GaN HEMTs
Y. Guhel, B. Boudart, M.A. Poisson, Jean-Claude de Jaeger
10th European Workshop on Heterostructure Technology, HeTech 2000, 2000, Ulm, Germany. ⟨hal-00159034⟩
Finite element modeling of damping using piezoelectric materials
Anne-Christine Hladky, C. Granger
2000, pp.64-65. ⟨hal-00157823⟩
Towards terahertz circuits via InP micromachining techniques
S. Arscott, T. David, X. Melique, P. Mounaix, D. Lippens
2000, pp.561-564. ⟨hal-00158203⟩