Publications

• COMM

Conductance switching by light and electric field in new azobenzene derivatives-Gold Nano-particle self-assembled networks (NPSAN)

Yannick Viero, David Guérin, Ioana Dobra, Dominique Vuillaume, Jean Roncali, Philippe Blanchard, Stephane Lenfant

SYMOLESCO, Feb 2015, Engelberg, Switzerland. ⟨hal-02920626⟩

• COMM

MOVPE growth of InGaN alloys with high In content on ZnO template substrates

Suresh Sundaram, Renaud Puybaret, Dave J. Rogers, Ferechteh Hosseini Teherani, Eric Vinod Sandana, Philippe Bove, Youssef El Gmili, David Troadec, Gilles Patriarche, Paul L Voss, Jean-Paul Salvestrini, Abdallah Ougazzaden

SPIE Photonics West, Feb 2015, San Francisco, United States. ⟨hal-01257106⟩

• ART

Non-Arrhenius conduction due to the interface-trap-induced disorder in X-doped amorphous In-X-Zn oxides thin-film transistors

Mohammed Benwadih, Jan Chroboczek, Gérard Ghibaudo, Romain Coppard, Dominique Vuillaume

Thin film transistors, with channels composed of In-X-Zn oxides, IXZO, with X dopants: Ga, Sb, Be, Mg, Ag, Ca, Al, Ni, and Cu, were fabricated and their I-V characteristics were taken at selected temperatures in the 77 K < T < 300 K range. The low field mobility, μ, and the interface defect…

Journal of Applied Physics, 2015, 117 (5), pp.055707. ⟨10.1063/1.4907681⟩. ⟨hal-01947633⟩

• THESE

Theoretical and numerical study of nonlinear phononic crystals, Etude théorique et numérique des cristaux phononiques non linéaires

Pierre-Yves Guerder

This work is dedicated to the theoretical and numerical study of nonlinear phononic crystals. The studied nonlinearities are those due to the second (quadratic) and third (cubic) order elastic constants of the materials that constitute the crystals. Nonlinear effects are studied by the means of…, Ce travail porte sur l'étude théorique et numérique des cristaux phononiques non linéaires. Les non linéarités étudiées sont celles dues aux constantes élastiques d'ordre deux (quadratiques) et trois (cubiques) des matériaux constituant les cristaux. Les effets non linéaires sont étudiés…

Micro and nanotechnologies/Microelectronics. Ecole Centrale de Lille; University of Arizona, 2015. English. ⟨NNT : 2015ECLI0006⟩. ⟨tel-01491094⟩

• ART

Assessing whole-body absorption cross section for diffuse exposure from reverberation chamber measurements

Aliou Bamba, Davy Gaillot, Emmeric Tanghe, Guenter Vermeeren, Wout Joseph, M. Lienard, Luc Martens

An original experimental protocol is developed to assess the whole-body absorption cross section of objects with arbitrary shapes and materials in diffuse fields at any operating frequency. This approach is important for dosimetry specifically in realistic environments wherein diffuse fields can be…

IEEE Transactions on Electromagnetic Compatibility, 2015, 57, pp.27-34. ⟨10.1109/TEMC.2014.2359239⟩. ⟨hal-03346259⟩

• ART

THz communications using photonics and electronic devices: the race to data-rate

Guillaume Ducournau, P. Szriftgiser, Fabio Pavanello, Emilien Peytavit, Mohammed Zaknoune, Denis Bacquet, Alexandre Beck, Tahsin Akalin, Jean-Francois Lampin

With the mass development of mobile data transfers, wireless communications have recently entered a new area: the carrier frequency is now entering the THz region. After a brief overview of context and key features of THz communication, focus is given on photonic-based THz emitters based on quasi-…

Journal of Infrared, Millimeter and Terahertz Waves, 2015, 36 (2), pp.198-220. ⟨10.1007/s10762-014-0112-x⟩. ⟨hal-03286167⟩

• ART

Design and measurement of AFM probe based on MEMS resonator

Zhuang Xiong, Bernard Legrand

In order to effectively prompt the resonance frequency and the quality factor of atomic force microscope (AFM) probes simultaneously, a novel oscillating probe based on a I2 shaped MEMS resonator was conceived, designed, fabricated and evaluated. To further improve the imaging capability of this…

High Power Laser and Particle Beams, 2015, 27 (2), pp.024119-1. ⟨10.11884/HPLPB201527.024119⟩. ⟨hal-01961045⟩

• ART

Rapid thermal annealing of cerium dioxide thin films sputtered onto silicon (111) substrates: Influence of heating rate on microstructure and electrical properties

Y. Guhel, T. Toloshniak, J. Bernard, A. Besq, Rosine Coq Germanicus, J. El Fallah, J.C. Pesant, P. Descamps, B. Boudart

The impact of the heating rate (HR) of a Rapid Thermal Annealing (RTA) on the crystallinity and on the morphology of CeO2 thin films has been investigated by Raman Spectroscopy (RS), Photoluminescence (PL), Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and tapping mode…

Materials Science in Semiconductor Processing, 2015, 30, pp.352 - 360. ⟨10.1016/j.mssp.2014.10.010⟩. ⟨hal-01646795⟩

• COUV

Electronique Moléculaire

S. Berciaud, C. Bucher, J. Coraux, F. Cherioux, A. d'Aleo, Guillaume Dujardin, Bruno Fabre, V. Huc, B. Jousselme, J. C. Lacroix, S. Latil, L. Limot, H. Oughaddou, Dominique Vuillaume, J. Weiss

Observatoire des micro et nanotechnologies. Micro et Nanotechnologies : Avancées, tendances et perspectives, pp.46−61, 2015, ⟨10.14756/OMNT.BILAN.2015⟩. ⟨hal-01444093⟩

• THESE

Modélisation des contrôles non-destructifs par ondes ultrasonores guidées. Application aux contrôles de canalisations, Modelling of non-destructive testing by ultrasonic guided waves : application to pipeline inspection

Mohammed Marouane El Bakkali

La thèse s’inscrit dans les travaux du CEA LIST pour développer dans la plate-forme CIVA un module simulant le contrôle non-destructif (CND) par ondes ultrasonores guidées ; elle est dédiée au développement et à la validation de modèles simulant l’inspection de canalisations et se focalise sur le…, The thesis is in the framework of developments made at CEA LIST of a module of the CIVA platform to simulate nondestructive testing (NDT) by ultrasonic guided waves; it is dedicated to the development and the validation of models simulating the examination of pipelines and is focussed on the case…

Mécanique des matériaux [physics.class-ph]. Université de Valenciennes et du Hainaut-Cambresis, 2015. Français. ⟨NNT : 2015VALE0004⟩. ⟨tel-01222291⟩