Publications

Affichage de 7611 à 7620 sur 16232


  • Communication dans un congrès

InAlAs/InGaAa HEMTs on polyimide flexible substrate with high cut-off frequencies

J.S. Shi, Nicolas Wichmann, Yannick Roelens, S. Bollaert

Journées Nationales Technologies Emergentes en Micro-Nanofabrication, JNTE 2013, 2013, Evian, France. ⟨hal-00813609⟩

  • Autre publication scientifique

Vers une électronique terahertz : contribution à la technologie des transistors III-V

Mohammed Zaknoune

2013. ⟨hal-00813614⟩

  • Communication dans un congrès

Laser ultrasonics and mode conversion for flaw depth gauging

Frédéric Faëse, Frédéric Jenot, Mohammadi Ouaftouh, Marc Duquennoy, Mohamed Ourak

Compared to earliest non destructive testing and evaluation methods based on transducers, laser ultrasonics shows specific advantages. It is a non-contact method combining a high spatial resolution and a large bandwidth, allowing high temperature and/or geometrically complex materials testing. In…

13th International Symposium on Nondestructive Characterization of Materials, NDCM-XIII, 2013, Le Mans, France. paper 15509, 9 p. ⟨hal-00971600⟩

  • Communication dans un congrès

Interferometric scanning microwave microscope for nanotechnology application

N. Clement, Thomas Dargent, H. Tanbakuchi, K. Nishiguchi, R. Sivakumarasamy, F. Wang, A. Fujiwara, D. Ducatteau, Gilles Dambrine, D. Vuillaume, Bernard Legrand, D. Theron

American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States. ⟨hal-00811777⟩

  • Article dans une revue

Toroidal wave in multilayered spherical curved plates

J.G. Yu, Jean-Etienne Lefebvre, L. Elmaimouni

Journal of Sound and Vibration, 2013, 332, pp.2816-2830. ⟨10.1016/j.jsv.2012.12.032⟩. ⟨hal-00808154⟩

  • Communication dans un congrès

Microwave evaluation performance of BST thin films with different orientations : application to a Hairpin filter

Denis Remiens, Freddy Ponchel, A. Ghalem, T. Lasri

3rd China-French Symposium on Advanced Materials, CFSAM-3, 2013, Bordeaux, France. ⟨hal-00811833⟩