Publicaciones

• Communication dans un congrès

Negative bias stress effect in pentacene thin-film transistors

C. Petit, D. Zander, K. Lmimouni, M. Ternisien, S. Lenfant, D. Vuillaume

4th International Meeting on Molecular Electronics, ElecMol'08, 2008, Grenoble, France. ⟨hal-00361616⟩

• Communication dans un congrès

Towards high performance E-mode InAlN/GaN HEMTs

F Medjdoub, M. Alomari, J.F. Carlin, M. Gonschorek, E. Feltin, M.A. Py, Christophe Gaquière, N. Grandjean, E. Kohn

32nd Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2008, 2008, Belgium. pp.97-98. ⟨hal-00361120⟩

• Autre publication scientifique

Propagation confocale et diffusion Brillouin de faisceaux acoustiques conjugués en phase

M. Ivanov

2008. ⟨hal-00375437⟩

• Communication dans un congrès

Geophysical detection of underground cavities

Lynda Driad-Lebeau, Bogdan Piwakowski, Peter Styles, Bernard Bourgeois, Isabelle Contrucci

In this paper, we present a synthesis of the geophysical investigations conducted on experimental sites selected in the Lorraine salt basin and Haute-Normandie marlpits. These investigations were carried out in the frame of a partnership (scientific and industrial) research program on cavities..., Ce papier présente une synthèse des investigations géophysiques menées sur des sites expérimentaux du bassin salifère lorrain et les marnières de Haute-Normandie. Ces travaux ont été réalisés dans le cadre d'un programme de recherche partenarial axé sur la détection et la caractérisation des...

Symposium Post-Mining 2008, Feb 2008, Nancy, France. pp.NC. ⟨ineris-00973287⟩

• Article dans une revue

Numerical analysis of negative refraction of transverse waves in an elastic material

Anne-Christine Hladky, Jerome O. Vasseur, Bertrand Dubus, Bahram Djafari-Rouhani, D. Ekeom, B. Morvan

Journal of Applied Physics, 2008, 104, pp.064906-1-6. ⟨10.1063/1.2978379⟩. ⟨hal-00356649⟩

• Article dans une revue

Nanoscale investigations of switching properties and piezoelectric activity in ferroelectric thin films using piezoresponse force microscopy

Rachel Desfeux, Anthony Ferri, Céline Legrand, Luc Maes, Antonio Da Costa, G. Poullain, R. Bouregba, Caroline Soyer, Denis Remiens

International Journal of Nanotechnology, 2008, 5, 827-837, Special Issue on Nanotechnology in France. Part I : C'nano Nord-Ouest. ⟨10.1504/IJNT.2008.018701⟩. ⟨hal-00360329⟩

• Article dans une revue

Ballistic nanodevices for high frequency applications

C. Gardes, Yannick Roelens, S. Bollaert, J.S. Galloo, X. Wallart, A. Curutchet, Christophe Gaquière, J. Mateos, T. Gonzalez, B.G. Vasallo, L. Bednarz, I. Huynen

International Journal of Nanotechnology, 2008, 5, 796-808, Special Issue on Nanotechnology in France. Part I : C'nano Nord-Ouest. ⟨10.1504/IJNT.2008.018698⟩. ⟨hal-00356665⟩

• Communication dans un congrès

Particles separation by oscillation in a capillary tube

A. Merlen, Farzam Zoueshtiagh, P.J. Thomas

6th International Conference on Nanochannels, Microchannels, and Minichannels, ASME ICNMM2008, 2008, Darmstadt, Germany. Paper ICNMM2008-62122, 1133-1138, ⟨10.1115/ICNMM2008-62122⟩. ⟨hal-00800972⟩

• Communication dans un congrès

New global blind equalization with auto phase rotation correction

A. Zaouche, Iyad Dayoub, C. Tatkeu, Jean-Michel Rouvaen

3rd International Symposium on Communications, Control and Signal Processing, ISCCSP 2008, 2008, Malta. pp.53-57, ⟨10.1109/ISCCSP.2008.4537191⟩. ⟨hal-00360433⟩

• Communication dans un congrès

Temperature measurement by microwave radiometry

Pierre-Yves Cresson, C. Ricard, Luc Dubois, Sébastien Vaucher, Tuami Lasri, Joseph Pribetich

Temperature is an important parameter in the industrial world. For example, temperature control is of a greater concern in food processing industry for safety reasons as well as for product quality. Recently, microwave processing of powder metallurgical bodies has been shown to be very promising....

IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2008, May 2008, Victoria, Canada. pp.1344-1349, ⟨10.1109/IMTC.2008.4547251⟩. ⟨hal-00361034⟩