Publicaciones

• Article dans une revue

A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects

Arnaud Devos, Renaud Cote, Grégory Caruyer, Arnaud Lefevre

We present a way of using picosecond ultrasonics to simultaneously get the thickness and elastic properties of thin dielectric layers. This is based on the use of a blue probe which is shown to improve the detection of acousto-optic oscillations in the dielectric from which the sound velocity can...

Applied Physics Letters, 2005, 86, pp.211903. ⟨10.1063/1.1929869⟩. ⟨hal-00124474⟩

• Communication dans un congrès

Conception d'amplificateurs distribués en bande K avec une technologie CMOS SOI partiellement désertée 130 nm

C. Pavageau, M. Si Moussa, A. Siligaris, L. Picheta, Francois Danneville, J.P. Raskin, D. Vanhoenacker-Janvier, J. Russat, N. Fel

Actes des 14èmes Journées Nationales Microondes, 2005, Nantes, France. ⟨hal-00247447⟩

• Communication dans un congrès

Inelastic tunneling spectra of an alkyl self-assembled monolayer using a MOS tunnel junction as a test-bed

C. Petit, G. Salace, S. Lenfant, D. Vuillaume

14th Biennial Conference on Insulating Films on Semiconductors, 2005, Belgium. pp.398-401, ⟨10.1016/j.mee.2005.04.011⟩. ⟨hal-00247649⟩

• Communication dans un congrès

Fuzzy logic modelling of electrical properties – PANI/Dyneema® conductive fibres

B. Kim, V. Koncar, C. Dufour

5th World Textile Conference, AUTEX 2005, 2005, Portorož, Slovenia. ⟨hal-00247654⟩

• Communication dans un congrès

Spectroscopie diélectrique THz de biomolécules en solution

Vianney Mille, Nour Eddine Bourzgui, Bertrand Bocquet

Actes des 1ères Journées du GDR Térahertz, 2005, Montpellier, France. ⟨hal-00247709⟩

• Communication dans un congrès

High Accuracy 65nm OPC Verification: Full Process Window Model vs. Critical Failure ORC

Amandine Borjon, Jerome Belledent, Shumay D. Shang, Olivier Toublan, Corinne Miramond, Kyle Patterson, Kevin Lucas, Christophe Couderc, Yves Rody, Frank Sundermann, Jean-Christophe Urbani, Stanislas Baron, Yorick Trouiller, Patrick Schiavone

It is becoming more and more difficult to ensure robust patterning after OPC due to the continuous reduction of layout dimensions and diminishing process windows associated with each successive lithographic generation. Lithographers must guarantee high imaging fidelity throughout the entire range...

2005, pp.1750-1761. ⟨hal-00023223⟩

• Article dans une revue

8-GHz bandwidth spatial sampling modules for ultrafast random-signal analysis

N. Rolland, A. Benlarbi-Delai, A. Ghis, P.A. Rolland

Microwave and Optical Technology Letters, 2005, 44, pp.292-295. ⟨hal-00154904⟩

• Article dans une revue

Thermal and electrostatic reliability characterization in RF MEMS switches

Q.H. Duong, L. Buchaillot, D. Collard, P. Schmitt, X. Lafontan, Patrick Pons, F. Flourens, F. Pressecq

Microelectronics Reliability, 2005, 45, pp.1790-1793. ⟨hal-00154911⟩

• Autre publication scientifique

Etude et développement systèmique d'une machine à expansion à engrenages extérieurs pour un système de climatisation au CO2 pour automobiles

G. Rewers

2005. ⟨hal-00138635⟩

• Communication dans un congrès

Automatic biasing point extraction and design plan generation for analog IPs

R. Iskander, A. Kaiser, M.M. Louerat

2005, pp.907-910. ⟨hal-00138402⟩