Publicaciones

• ART

Concept of dielectric constant for nanosized systems

Christophe Delerue, Guy Allan, Michel Lannoo

The screening properties of dielectric nanocrystals are analyzed. General arguments confirmed by detailed numerical calculations are presented. It is shown how macroscopic components of the electric field can still be defined for sizes larger than a few Fermi wavelengths and can still be obtained...

Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2003, 68, pp.115411-1-4. ⟨10.1103/PhysRevB.68.115411⟩. ⟨hal-00146590⟩

• ART

Optical transitions in few-electron artificial atoms strongly confined in ZnO nanocrystals

Alexander Germeau, Aarnoud L. Roest, Daniel Vanmaekelbergh, Guy Allan, Christophe Delerue, Eric A. Meulenkamp

We have studied the optical transitions in artificial atoms consisting of one to ten electrons occupying the conduction levels in ZnO nanocrystals. We analyzed near IR absorption spectra of assemblies of weakly coupled ZnO nanocrystals for a gradually increasing electron number and found four...

Physical Review Letters, 2003, 90, pp.097401/1-4. ⟨10.1103/PhysRevLett.90.097401⟩. ⟨hal-00146610⟩

• COMM

The effect of quantum confinement on the optical properties of semiconductor nanocrystals

Christophe Delerue, Guy Allan

Materials Research Society Fall Meeting, 2003, Boston, MA, United States. ⟨hal-00146644⟩

• COMM

Charge transport in self-assembled molecular rectifying diodes on silicon

Christophe Delerue, Guy Allan, Stéphane Lenfant, Dominique Vuillaume, Christophe Krzeminski

Workshop France-USA on Molecular-Scale Electronics, 2003, Paris, France. ⟨hal-00146645⟩

• ART

60-GHz high power performance In0.32 Al0.68 As-In0.33 Ga 0.67 As metamorphic HEMTs on GaAs

M. Zaknoune, M. Ardouin, Y. Cordier, S. Bollaert, B. Bonte, Didier Theron

IEEE Electron Device Letters, 2003, 24, pp.724-726. ⟨hal-00146648⟩

• ART

Low frequency drain noise comparison of AlGaN/GaN HEMTs grown on silicon, SiC and sapphire substrates

A. Curutchet, N. Malbert, N. Touboul, Christophe Gaquière, A. Minko, M. Uren

Microelectronics Reliability, 2003, 43, pp.1713-1718. ⟨hal-00146665⟩

• COMM

Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions

Thierry Melin, H. Diesinger, D. Deresmes, D. Stiévenard

12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands. ⟨hal-00146614⟩

• COMM

Scanning tunnelling spectroscopy of low dimensional semiconductor system

B. Grandidier

7th International Workshop on Beam Induced Assessment of Microstructures in Semiconductors, BIAMS 2003, 2003, Lille, France. ⟨hal-00146647⟩

• COMM

Modélisation des antennes linéaires à l'aide de la méthode des éléments finis

Jamal Assaad, Anne-Christine Hladky, Sébastien Grondel, Emmanuel Moulin, B. Cugnet

Actes du Premier Congrès International sur la Modélisation Numérique Appliquée, CIMNA1-2003, 2003, Beyrouth, Liban. ⟨hal-00147107⟩

• COMM

The use of permanently-mounted surface transducers to characterize Lamb wave propagation

Laurent Duquenne, Faysal El Youbi, Emmanuel Moulin, Sébastien Grondel, Jamal Assaad, Christophe Delebarre

WCU 2003, Sep 2003, Paris, France. pp.6001-6004. ⟨hal-00147113⟩