Publicaciones
Affichage de 14241 à 14250 sur 16256
Investigations des propriétés magnéto-élastiques critiques induites par la nanostructuration des films à magnétostriction géante : applications MEMS
Steve Masson, S. Euphrasie, O. Ducloux, C. Sion, Philippe Pernod, Vladimir Preobrazhensky, Henri Le Gall, J.P. Jay, D. Spenato, S. Petit, Jamal Ben Youssef, J. Teillet, Jean Juraszek
Journées Nationales du Réseau Micro et Nano Technologies, 2003, Lille, France. ⟨hal-00146152⟩
Radiation of directional seismic sources in an elastic half-space
Madjid Berraki, Axelle Baroni, Bertrand Dubus
65th EAGE Conference & Exhibition, Jun 2003, Stavanger, Norway. pp.Z-99, ⟨10.3997/2214-4609-pdb.6.P235⟩. ⟨hal-00144886⟩
A novel approach using picosecond ultrasonics at variable laser-wavelength for the characterization of AlN films used for microsystem applications
Arnaud Devos, G. Caruyer, C. Zinck, P. Ancey
2003, pp.793-796. ⟨hal-00144891⟩
Description and analysis of a cone-like bubble structure in the cavitation field
A. Moussatov, Bertrand Dubus, C. Granger
Proceedings of the 4th Conference on the Applications of Power Ultrasound in Physical and Chemical Processing, 2003, Besançon, France. ⟨hal-00147751⟩
A new infrared microsensor
Katir Ziouche, Mohamed Boutchich, M. Achani, Pascale Godts, Didier Leclercq
Sensor 2003, 2003, Nuremberg, Germany. ⟨hal-00146386⟩
Electron microscopy analysis of MOSFET structures
J. Katcki, J. Ratajczak, A. Laszcz, F. Phillipp, Emmanuel Dubois, Guilhem Larrieu, Xavier Baie, Xiaohui Tang
IEEE 6th Symposium Diagnostics and Yield 2003, Jun 2003, Warsaw, Poland. pp.67-70. ⟨hal-00146402⟩
Microwave sensing of moisture profiles in layered materials
D. Glay, T. Lasri
2003, pp.71-78. ⟨hal-00146045⟩
Caractérisation non destructive d'objets enfouis par des techniques microondes
Latifa Achrait-Furlan, T. Lasri, Ahmed Mamouni
Actes de TELECOM 03 et 3èmes Journées Franco-Maghrébines des Microondes et leurs Applications, JFMMA 2003, 2003, Marrakech, Maroc. ⟨hal-00146027⟩
Very low Schottky barrier to n-type silicon with PtEr-stack silicide
Xing Tang, J. Katcki, Emmanuel Dubois, N. Reckinger, J. Ratajczak, G. Larrieu, P. Loumaye, O. Nisole, V. Bayot
Solid-State Electronics, 2003, 47 (11), pp.2105-2111. ⟨10.1016/S0038-1101(03)00256-9⟩. ⟨hal-00146401⟩