Publicaciones

Affichage de 14271 à 14280 sur 16058


  • COMM

Self-assembled materials

D. Vuillaume

International Summer School on Advanced Microelectronics, MIGAS 2003, 2003, Autrans, France. ⟨hal-00146172⟩

  • COMM

Self-assembled molecular rectifying diodes on silicon : synthesis, experimental and theoretical charge transport studies

Dominique Vuillaume, Stéphane Lenfant, Christophe Krzeminski, Guy Allan, Christophe Delerue

226th American Chemical Society National Meeting - Fall 2003, Sep 2003, New York, NY, United States. ⟨hal-00146383⟩

  • ART

Actionneurs films minces pour contrôle santé de structures

E. Fribourg-Blanc, M. Dupont, D. Osmont, Eric Cattan, Denis Remiens

Instrumentation, Mesure, Métrologie, 2003, 3, pp.225-237. ⟨hal-00146476⟩

  • COMM

Accordabilité d'un circuit microonde par adjonction d'un substrat cristal liquide

Nicolas Tentillier, Bertrand Splingart, Erick Paleczny, Jean-François Legier, Christian Legrand

Treizièmes Journées Nationales Micro-ondes (JNM 2003), May 2003, Lille, France. pp.3D-4. ⟨hal-00146562⟩

  • ART

A new concept of focusing antennas using plane-parallel Fabry-Perot cavities with non-uniform mirrors

Ronan Sauleau, Philippe Coquet, T. Matsui, J.P. Daniel

IEEE Transactions on Antennas and Propagation, 2003, 51 (11), pp.3171-3175. ⟨hal-00553218⟩

  • COMM

Electrostatical coupling-spring for micro-mechanical filtering applications

D. Galayko, A. Kaiser, L. Buchaillot, D. Collard, C. Combi

2003, pp.530-533. ⟨hal-00146403⟩

  • ART

Design, realization and testing of micro-mechanical resonators in thick-film silicon technology with postprocess electrode to resonator gap reduction

D. Galayko, A. Kaiser, L. Buchaillot, Bernard Legrand, D. Collard, C. Combi

Journal of Micromechanics and Microengineering, 2003, 13, pp.134-140. ⟨hal-00146391⟩

  • COMM

Ultimate technology for micromachining of nanometric gap HF micromechanical resonators

E. Quevy, Bernard Legrand, D. Collard, L. Buchaillot

2003, pp.157-160. ⟨hal-00146462⟩

  • COMM

Electro-optical probe dedicated to the on-line testing of electronic systems

B. Pannetier, P. Lemaitre-Auger, S. Tedjini, El Hadj Dogheche, Denis Remiens

2003, pp.275. ⟨hal-00162741⟩