Publicaciones
Affichage de 14841 à 14850 sur 16231
Characterization of phosphorus and boron heavily doped LPCVD polysilicon films in the temperature range 293-373K
Mohamed Boutchich, Katir Ziouche, Pascale Godts, Didier Leclercq
IEEE Electron Device Letters, 2002, 23 (3), pp.139-141. ⟨10.1109/55.988817⟩. ⟨hal-00148729⟩
Vacuum and cryogenic station for Micro-Electro-Mechanical Systems probing and testing
Bernard Legrand, E. Quévy, B. Stefanelli, D. Collard, L. Buchaillot
Review of Scientific Instruments, 2002, 73, pp.4393-4395. ⟨hal-00148782⟩
Reliability of packaging MEMS in shock environment : crack and stiction modeling
O. Millet, D. Collard, L. Buchaillot
2002, pp.696-703. ⟨hal-00148789⟩
Diffusion d'un élement V à partir d'une surface d'un semiconducteur III-V, influence de la reconstruction et de la morphologie
C. Priester
Journées Surfaces et Interfaces, JSI 2002, 2002, Toulouse, France. ⟨hal-00149684⟩
Grazing incidence diffraction anomalous fine structure of self-assembled semiconductor nanostructures
S. Grenier, A. Letoublon, M.G. Proietti, Hubert Renevier, L. Gonzalez, J.M. Garcia, C. Priester, J. Garcia
2002, pp.24-33. ⟨hal-00149685⟩
Thermally assisted formation of silicon islands on a silicon-on-insulator substrate
Bernard Legrand, Vincent Agache, Jean-Philippe Nys, Thierry Melin, Vincent Senez, Didier Stiévenard
Journal of Applied Physics, 2002, 91, pp.106-111. ⟨10.1063/1.1420761⟩. ⟨hal-00149668⟩
Fabrication and characterization of laterally coupled lasers
S. Mc Murtry, Jean-Pierre Vilcot, F. Mollot, Didier Decoster
2002, pp.367-374. ⟨hal-00149638⟩
Caractérisation diélectrique en réflexion transmission de cristaux liquides en structure ligne plaquée
Abdellatif Akjouj, Bahram Djafari-Rouhani, Jerome O. Vasseur, Jean-François Legier, Erick Paleczny, Mohamed Bouazaoui, Jean-Pierre Vilcot, Arnaud Beaurain, Stefan Mc Murtry, L. Dobrzynski
Actes des 7èmes Journées de Caractérisation Microondes et Matériaux, JCMM 2002, 2002, Toulouse, France. ⟨hal-00149649⟩
Du modèle de canal de propagation à l'optimisation des systèmes de télécommunications
M. Lienard
2002. ⟨hal-00577049⟩
High-frequency high-Q micro-mechanical resonators in thick epipoly technology with post-process gap adjustment
D. Galayko, A. Kaiser, Bernard Legrand, C. Combi, D. Collard, L. Buchaillot
2002, pp.665-668. ⟨hal-00148737⟩