Publicaciones
Affichage de 14861 à 14870 sur 16175
A modified bosch-type process for precise surface micromachining of polysilicon
E. Quevy, B. Parvais, J.P. Raskin, L. Buchaillot, D. Flandre, D. Collard
Journal of Micromechanics and Microengineering, 2002, 12, pp.328-333. ⟨hal-00148763⟩
Characterisation of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films
S.T. Davies, E.C. Havey, H. Jin, J.P. Hayes, M.K. Ghantasala, I. Roch, L. Buchaillot
Smart Materials and Structures, 2002, 11, pp.708-714. ⟨hal-00148762⟩
Adhesive forces investigation on a silicon tip by contact mode atomic force microscope
Vincent Agache, Bernard Legrand, Dominique Collard, Lionel Buchaillot
Applied Physics Letters, 2002, 81, pp.2623-2625. ⟨10.1063/1.1508806⟩. ⟨hal-00148768⟩
Room temperature passivation of the silicon surface by chemisorption of an organic monolayer
S. Kar, D. Vuillaume
202nd ElectroChemical Society Meeting, 2002, Salt Lake City, UT, United States. ⟨hal-00148726⟩
Performance of DS-CDMA on the 60 GHz channel
Laurent Clavier, M. Fryziel, Christelle Garnier, Yves Delignon, David Boulinguez
The 13th IEEE International Symposium on Personal, Indoor and Mobile Radio Communications, Sep 2002, Lisbon, Portugal. pp.2332-2336, ⟨10.1109/PIMRC.2002.1046561⟩. ⟨hal-00148328⟩
A new empirical non-linear model for SOI MOSFET
A. Siligaris, M. Vanmackelberg, Gilles Dambrine, N. Vellas, Francois Danneville
2002, pp.101-104. ⟨hal-00147833⟩
Path loss model of the 60 GHz indoor radio channel
M. Fryziel, Christophe Loyez, Laurent Clavier, N. Rolland, P. Rolland
Microwave and Optical Technology Letters, 2002, 34, pp.158-162. ⟨hal-00147879⟩
Influence of the microstructure and of an ION beam etching on the domain propagation in PZT thin films
Brice Gautier, Caroline Soyer, Eric Cattan, Denis Remiens, Jean-Claude Labrune
Integrated Ferroelectrics, 2002, 50 (1), pp.231-240. ⟨10.1080/10584580215530⟩. ⟨hal-00149627⟩
Reactive ion beam etching effects on maskless PZT properties
Caroline Soyer, Eric Cattan, Denis Remiens
Integrated Ferroelectrics, 2002, 48, pp.221-229. ⟨10.1080/10584580215465⟩. ⟨hal-00149624⟩
Characterization of mems devices using a polarisation interferometer
D. Jenkins, W. Clegg, X. Liu, E. Fribourg-Blanc, Eric Cattan
Integrated Ferroelectrics, 2002, 50, pp.91-99. ⟨hal-00149626⟩