Publicaciones

Affichage de 14861 à 14870 sur 16175


  • Article dans une revue

A modified bosch-type process for precise surface micromachining of polysilicon

E. Quevy, B. Parvais, J.P. Raskin, L. Buchaillot, D. Flandre, D. Collard

Journal of Micromechanics and Microengineering, 2002, 12, pp.328-333. ⟨hal-00148763⟩

  • Article dans une revue

Characterisation of micromachining processes during KrF excimer laser ablation of TiNi shape memory alloy thin sheets and films

S.T. Davies, E.C. Havey, H. Jin, J.P. Hayes, M.K. Ghantasala, I. Roch, L. Buchaillot

Smart Materials and Structures, 2002, 11, pp.708-714. ⟨hal-00148762⟩

  • Communication dans un congrès

Room temperature passivation of the silicon surface by chemisorption of an organic monolayer

S. Kar, D. Vuillaume

202nd ElectroChemical Society Meeting, 2002, Salt Lake City, UT, United States. ⟨hal-00148726⟩

  • Communication dans un congrès

Performance of DS-CDMA on the 60 GHz channel

Laurent Clavier, M. Fryziel, Christelle Garnier, Yves Delignon, David Boulinguez

The goal of the paper is to show that a Gaussian approximation can be used to model the global noise in a DS-CDMA system on a 60 GHz frequency band. We show that this approximation can also include the noise due to multipath and to imperfections in power control. The model can then be used as a...

The 13th IEEE International Symposium on Personal, Indoor and Mobile Radio Communications, Sep 2002, Lisbon, Portugal. pp.2332-2336, ⟨10.1109/PIMRC.2002.1046561⟩. ⟨hal-00148328⟩

  • Communication dans un congrès

A new empirical non-linear model for SOI MOSFET

A. Siligaris, M. Vanmackelberg, Gilles Dambrine, N. Vellas, Francois Danneville

2002, pp.101-104. ⟨hal-00147833⟩

  • Article dans une revue

Path loss model of the 60 GHz indoor radio channel

M. Fryziel, Christophe Loyez, Laurent Clavier, N. Rolland, P. Rolland

Microwave and Optical Technology Letters, 2002, 34, pp.158-162. ⟨hal-00147879⟩

  • Article dans une revue

Characterization of mems devices using a polarisation interferometer

D. Jenkins, W. Clegg, X. Liu, E. Fribourg-Blanc, Eric Cattan

Integrated Ferroelectrics, 2002, 50, pp.91-99. ⟨hal-00149626⟩