Publicaciones

Affichage de 15521 à 15530 sur 16105


  • Communication dans un congrès

Underwater characteristics of cymbal transducers and arrays

J. Zhang, J. Hughes, Anne-Christine Hladky, R.E. Newnham

ONR Workshop on Acoustic Transduction Materials and Devices, 2000, University Park, United States. ⟨hal-00157837⟩

  • Article dans une revue

An accurate and efficient high frequency noise simulation technique for deep submicron MOSFETs

J.S. Goo, C.H. Choi, Francois Danneville, E. Morifuji, H.S. Momose, Z. Yu, H. Iwai, T.H. Lee, R.W. Dutton

IEEE Transactions on Electron Devices, 2000, 47, pp.2410-2419. ⟨hal-00157860⟩

  • Communication dans un congrès

Acoustic scattering in time domain using the boundary element method

A. Lavie, Bertrand Dubus, A. El Ghaouty

2000, pp.129-133. ⟨hal-00157820⟩

  • Communication dans un congrès

Numerical modeling of magnetostrictive materials using the finite element code ATILA

J. Coutte, E. Lenglet, Bertrand Dubus

US Navy Workshop on Acoustic Transduction Materials and Devices, 2000, State College, United States. ⟨hal-00157834⟩

  • Article dans une revue

The indium content in metamorphic InAlAs/InGaAs HEMTs on GaAs substrate : a new structure parameter

S. Bollaert, Y. Cordier, M. Zaknoune, H. Happy, Virginie Hoel, Sylvie Lepilliet, D. Theron, A. Cappy

Solid-State Electronics, 2000, 44, pp.1021-1027. ⟨hal-00157879⟩

  • Article dans une revue

Dependence of the carrier lifetime on acceptor concentration in GaAs grown at low-temperature under different growth and annealing conditions

M. Stellmacher, J. Nagle, Jean-Francois Lampin, P. Santoro, J. Vaneecloo, Antigoni Alexandrou

Journal of Applied Physics, 2000, 88, pp.6026-6031. ⟨hal-00158228⟩

  • Communication dans un congrès

On 2D/3D numerical oxidation modeling : calibration and investigation of silicon crystal orientation effect on stresses in shallow trench isolations

T. Hoffmann, K.F. Dombrowski, V. Senez

2000, pp.59-62. ⟨hal-00158513⟩

  • Communication dans un congrès

Growth of strained Ga1-xInxP layers on GaP (001) by gas source molecular beam epitaxy : comparison with the GaInAs/GaAs system

X. Wallart, D. Deresmes, F. Mollot

2000, pp.231-234. ⟨hal-00158442⟩