Publications

Affichage de 11051 à 11060 sur 16055


  • ART

Metamorphic high electron mobility Te-doped AlInSb/GaInSb heterostructures on InP (001)

G. Delhaye, L. Desplanque, X. Wallart

Journal of Applied Physics, 2008, 104 (6), pp.066105. ⟨10.1063/1.2978365⟩. ⟨hal-00356944⟩

  • COMM

Particles separation by oscillation in a capillary tube

A. Merlen, Farzam Zoueshtiagh, P.J. Thomas

6th International Conference on Nanochannels, Microchannels, and Minichannels, ASME ICNMM2008, 2008, Darmstadt, Germany. Paper ICNMM2008-62122, 1133-1138, ⟨10.1115/ICNMM2008-62122⟩. ⟨hal-00800972⟩

  • COMM

Analysis of trap states effects on the frequency-dependent capacitance and conductance of an AlGaN/GaN heterostructure

A. Telia, A. Meziani, A. Soltani

2nd International Conference Signals, Circuits and Systems, SCS 2008, 2008, Hammamet, Tunisia. pp.1-5, ⟨10.1109/ICSCS.2008.4746881⟩. ⟨hal-00800977⟩

  • ART

Influence of thermal aging on optical fiber properties

F. Tarrach, A. Ch'Hayder, S. Guermazi, Guillaume Ducournau, M. Ketata

Optical Engineering, 2008, 47, pp.065006. ⟨10.1117/1.2948319⟩. ⟨hal-00800676⟩

  • ART

Finite difference time domain (FDTD) analysis of new applicators for hyperthermia and evaluation of the SAR distribution in human head near cellular phone

S. Bri, A. Saadi, M. Habibi, A. Nakheli, L. Zenkovar, L. Bellarbi, A. Mamouni

AMSE Modelling, Measurement and Control, Series C : Chemistry, Geology, Environment and Bioengineering, 2008, 69, pp.34-52. ⟨hal-00800672⟩

  • ART

Influence of inelastic processes on fast-atom-surface diffraction

F. Aigner, N. Simonovic, B. Solleder, L. Wirtz, J. Burgdorfer

Journal of Physics: Conference Series, 2008, 133, pp.012014-1-8. ⟨10.1088/1742-6596/133/1/012014⟩. ⟨hal-00800707⟩

  • ART

Local piezoelectric hysteresis loops for the study of electrical properties of 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) thin films : bottom electrode dependence and film thickness effect

Anthony Ferri, Antonio Da Costa, Sebastien Saitzek, Rachel Desfeux, M. Detalle, G.S. Wang, Denis Remiens

Ferroelectrics, 2008, 362, pp.21-29. ⟨10.1080/00150190801997427⟩. ⟨hal-00360337⟩