Publications

Affichage de 11591 à 11600 sur 16059


  • COMM

Metamaterials-based Routing Devices for Space Applications

Fuli Zhang, Gregory Houzet, Sylvain Potet, Eric Lheurette, Michel Chaubet, Didier Lippens

2007 International Symposium on Signals, Systems and Electronics, Jul 2007, Montreal, Canada. pp.223-226. ⟨hal-02018041⟩

  • PROCEEDINGS

Low frequency noise in La0.7Sr0.3MnO3 thin films : effects of substrate materials and contact resistance

J.-M. Routoure, L. Méchin, D. Fadil, C. Barone, S. Mercone, P. Perna, S. Flament

AIP, pp.229-232, 2007, ⟨10.1063/1.2759672⟩. ⟨hal-04188817⟩

  • PATENT

Circuit de filtrage à transconductance, en particulier pour un téléphone cellulaire

D. Chamla, A. Cathelin, A. Kaiser

N° de brevet: EP1806842 (A1). 2007. ⟨hal-00372347⟩

  • PATENT

Procédé de contrôle du rapport des facteurs d'amplification de deux amplificateurs linéaires, et dispositif correspondant

D. Chamla, A. Cathelin, A. Kaiser

N° de brevet: FR2895846 (A1). 2007. ⟨hal-00372346⟩

  • ART

Microstructural Characterization of Semipolar GaN Templates and Epitaxial-Lateral-Overgrown Films Deposited on M -Plane Sapphire by Metalorganic Vapor Phase Epitaxy

Philippe Vennegues, Zahia Bougrioua, Tobias Guehne

Japanese Journal of Applied Physics, 2007, 46 (7A), pp.4089-4095. ⟨10.1143/JJAP.46.4089⟩. ⟨hal-02906718⟩

  • ART

A silicon beam-based microcantilever nanoelectrosprayer

S. Arscott, Bernard Legrand, Lionel Buchaillot, Alison Ashcroft

Sensors and Actuators B: Chemical, 2007, 125 (1), pp.72-78. ⟨10.1016/j.snb.2007.01.040⟩. ⟨hal-02347442⟩

  • ART

A 200-GHz true E-mode low-noise MHEMT

Hassan Maher, Ikram El Makoudi, Peter Frijlink, Derek Smith, Marc Rocchi, S. Bollaert, Sylvie Lepilliet, Gilles Dambrine

In this paper, a fully passivated true enhancement mode 110-nm metamorphic high-electron mobility transistor (E-MHEMT) on GaAs substrate with excellent dc and RF performance has been developed. By choosing an indium content of 40% for the AlInAs/GalnAs/AlInAs MHEMT, the difference between the…

IEEE Transactions on Electron Devices, 2007, 54 (7), pp.1626-1632. ⟨10.1109/TED.2007.899377⟩. ⟨hal-00255758⟩