Publications

Affichage de 13541 à 13550 sur 16407


  • Communication dans un congrès

Impact of the intrinsic parameters of the dielectric on the leakage current

G. Larrieu, M. Tao

2nd International Workshop on Advanced Gate Stack Technology, 2005, Austin, TX, United States. ⟨hal-00138407⟩

  • Communication dans un congrès

Explicit versus implicit finite-difference approximation for semiconductor device time-domain macroscopic numerical modelling on parallel computer

A. El Moussati, Christophe Dalle

Proceedings of the 15th Workshop on Modelling and Simulation of Electron Devices, 2005, Pisa, Italy. ⟨hal-00131335⟩

  • Article dans une revue

Biaxial initial stress characterization of bilayer gold RF-switches

K. Yacine, F. Flourens, David Bourrier, Ludovic Salvagnac, P. Calmont, X. Lafontan, Q.H. Duong, L. Buchaillot, D. Peyrou, Patrick Pons, Robert Plana

Microelectronics Reliability, 2005, 45, pp.1776-1781. ⟨10.1016/j.microrel.2005.07.093⟩. ⟨hal-00128652⟩

  • Communication dans un congrès

On the high-frequency noise figures of merit and microscopic channel noise sources in fabricated 90 nm PD SOI MOSFETs

R. Rengel, M.J. Martin, G. Pailloncy, Gilles Dambrine, Francois Danneville

2005, pp.745-748. ⟨hal-00125309⟩

  • Communication dans un congrès

Dual-wavelength multimode fibre transmission of digital and RF signals

C. Sion, A. Roche, A. da Costa de Matos, Christophe Loyez, C. Lethien, R. Hamelin, Jean-Pierre Vilcot

12th NEFERTITI Workshop PWCom, 2005, Sähörus, Sweden. ⟨hal-00125337⟩