Publications
Affichage de 15151 à 15160 sur 16175
Determination of the electrical properties of ultrathin silicon-based dielectric films : thermally grown SiNx
N. Pic, A. Glachant, S. Nitsche, J.Y. Hoarau, D. Goguenheim, D. Vuillaume, A. Sibai, C. Chanelière
Solid-State Electronics, 2001, 45, pp.1265-1270. ⟨hal-00152162⟩
Equivalence of electrical circuits and micro-mechanical oscillating structures and its application to complex filter structures
D. Galayko, A. Kaiser
2001, pp.373-376. ⟨hal-00152240⟩
Elasto-plastic modeling of microelectronics materials for accurate prediction of the mechanical stresses in advanced silicon technologies
V. Senez, T. Hoffmann
2001, pp.58-61. ⟨hal-00152209⟩
Noise optimization of ultra-short gate HEMTs using Monte Carlo simulation
J. Mateos, T. Gonzales, D. Pardo, S. Bollaert, T. Parenty, A. Cappy
2001, pp.245-248. ⟨hal-00151775⟩
70nm gate InP-based HEMTs with high ft and fmax
T. Parenty, S. Bollaert, J. Mateos, X. Wallart, A. Cappy
11th European Heterostructure Technology Workshop, HETECH 01, 2001, Padova, Italy. ⟨hal-00151776⟩
Ka band power pHEMT technology for space power flip-chip assembly
E. Rogeaux, J.P. Fraysse, C. Schaffauser, S. George, D. Pons, P. Fellon, D. Geiger, D. Theron, N. Haese, Serge Verdeyme, R. Quere, Dominique Baillargeat, E. Ngoya, S. Long, Laurent Escotte
2001, pp.1895-1898. ⟨hal-00152621⟩
Etude des contacts ohmiques de HEMTs dans la filière GaN
Y. Guhel, B. Boudart, T. Heim, N. Grandjean, F. Omnes, Jean-Claude de Jaeger
8èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2001, 2001, Aussois, France. ⟨hal-00152671⟩
Etude de l'effet de la topologie sur l'ionisation par impact à l'aide de mesures d'électroluminescence
Christophe Gaquière, B. Boudart, P.A. Dhamelincourt
8èmes Journées Nationales Microélectronique et Optoélectronique, JNMO 2001, 2001, Aussois, France. ⟨hal-00152675⟩