Publications

Affichage de 6791 à 6800 sur 16058


  • COMM

On wafer silicon integrated noise source characterization up to 110 GHz based on germanium-on-silicon photodiode

Sandrine Oeuvrard, Jean-Francois Lampin, Guillaume Ducournau, Sylvie Lepilliet, Francois Danneville, Thomas Quemerais, Daniel Gloria

In this work, a new concept of photonic noise source has been developed and characterized, based on Germanium-on-Silicon high speed photodiode (GeHSPD). This photodiode RF output power has been preliminary characterized up to 210 GHz, using a dedicated optoelectronic bench and demonstrating…

27th IEEE International Conference on Microelectronic Test Structures, ICMTS 2014, 2014, Udine, Italy. pp.150-154, ⟨10.1109/ICMTS.2014.6841484⟩. ⟨hal-01055046⟩

  • COMM

[Invited] 3D substrates for improved performance of Li-ion microbatteries

Etienne Eustache, Olivier Crosnier, Pascal Tilmant, Laurence Morgenroth, Pascal Roussel, Nathalie Rolland, Christophe Lethien, Thierry Brousse

10th Japan-France Joint Seminar on Battery, 2014, Hakone, Japan. ⟨hal-01044691⟩

  • ART

1 to 220 GHz complex permittivity behavior of flexible polydimethylsiloxane substrate

Pierre-Yves Cresson, Yovan Orlic, Jean-François Legier, Erick Paleczny, Luc Dubois, Nicolas Tiercelin, Philippe Coquet, Philippe Pernod, Tuami Lasri

Coplanar transmission lines (CPW) are realized on polydimethylsiloxane (PDMS) substrate in order to characterize its complex permittivity, from 1 to 220 GHz. By varying the complex permittivity, the propagation constant of the PDMS-CPW calculated with full wave software is matched to those…

IEEE Microwave and Wireless Components Letters, 2014, 24 (4), pp.278-280. ⟨10.1109/LMWC.2013.2295230⟩. ⟨hal-00980037⟩

  • COMM

Engineering of oxide based resistive switching for neuromorphic computing

F. Alibart, Selina La Barbera, G. Sassine, N. Najjari, Dominique Vuillaume

Journées Nationales du GdR OXYFUN " Oxydes fonctionnels : du matériau au dispositif ", 2014, Autrans, France. ⟨hal-01055005⟩

  • COMM

1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Pietro M. Ferreira, Cora Donche, Kamel Haddadi, Tuami Lasri, Gilles Dambrine, Christophe Gaquière, Thomas Quemerais, Daniel Gloria

Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for nanodevices characterization. In recent publications, SMM has demonstrated high…

12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS), Jun 2014, Trois-Rivieres, Canada. pp.385-388. ⟨hal-03224670⟩