Publicaciones
Affichage de 15421 à 15430 sur 16175
Frequency difference generation in the terahertz region using LTG-GaAs photodetector
Emilien Peytavit, Gaël Mouret, Jean-Francois Lampin, Pascal Masselin, P. Mounaix, F. Mollot, D. Lippens
8th International Conference on Terahertz Electronics, Sep 2000, Darmstadt, Germany. pp.45-48. ⟨hal-00158220⟩
Narrowband active GaAs MMIC filters in K-band
J. Vindevoghel, P. Descamps
2000, pp.147-150. ⟨hal-00158160⟩
Temperature control by microwave radiometry with narrow bandwidth
Luc Dubois, C. Vanoverschelde, V. Thomy, J.P. Sozanski, M. Chive
European Physical Journal: Applied Physics, 2000, 9, pp.63-68. ⟨hal-00158150⟩
FECTED oscillator optronic application feasibility
F. Driouch, M.R. Friscourt, Christophe Dalle
Solid-State Electronics, 2000, 44, pp.1455-1461. ⟨hal-00158131⟩
Finite element modeling of smart materials : application to an adaptative structure using SMA
Anne-Christine Hladky, S. Rafanomezantsoa, L. Buchaillot
2000, pp.133-142. ⟨hal-00157816⟩
Monolithic microwave integrated GaAs electromagnetically-coupled antennas
M. Grzeskowiak, J. Vindevoghel
2000, pp.170-173. ⟨hal-00158144⟩
Conduction band offset at the (AIxGa1-x)yIn1-y/Ga0.52In0.48P interface : a photoluminescence study
D. Vignaud, F. Mollot
Proceedings of the 11th International Conference on Molecular Beam Epitaxy, MBE XI, 2000, Beijing, China. ⟨hal-00158221⟩
Convertisseur de polarisation avec contrôle de phase intégré sur semiconducteur III-V de type AIGaAs/GaAs
N. Grossard, H. Porte, Jean-Pierre Vilcot, J.P. Goedgebuer
20èmes Journées Nationales d'Optique Guidée, 2000, Toulouse, France. ⟨hal-00158597⟩
Use of the time-frequency analysis approach in impact echo method - Example of application : detection of fault in concrete slab
O. Abraham, P. Cote, C. Leonard, Bogdan Piwakowski
5th International Symposium on Non-Destructive Testing in Civil Engineering, 2000, Japan. pp.463-469. ⟨hal-00250443⟩
Underground tunnels detection and location by high resolution seismic reflection
Bogdan Piwakowski, C. Leonard
5th International Symposium on Non-Destructive Testing in Civil Engineering, NDT-CE 2000, 2000, Japan. pp.415-425. ⟨hal-00250442⟩